A new approach to preparing tips for atom probe field ion microscopy from powder materials

Fang Wu; P. Bellon; M. L. Lau; E. J. Lavernia; T. A. Lusby; A. J. Melmed

doi:10.1016/S0921-5093(01)01884-6

A new approach to preparing tips for atom probe field ion microscopy from powder materials

Fang Wu, P. Bellon, M. L. Lau, E. J. Lavernia, T. A. Lusby, A. J. Melmed

Research output: Contribution to journal › Article › peer-review

Abstract

A new approach to preparing tips for atom probe field ion microscopy from powder materials is described. It is especially useful for particle sizes exceeding > 0.050 mm. Particles resulting from mechanical alloying of Cu and Ag, and from cryomilling of conventional Ni powders have been prepared this way for field ion imaging and atom probe composition analysis. In both cases, useful information complementing results from transmission electron microscopy and X-ray diffraction was obtained.

Original language	English (US)
Pages (from-to)	20-23
Number of pages	4
Journal	Materials Science and Engineering: A
Volume	327
Issue number	1
DOIs	https://doi.org/10.1016/S0921-5093(01)01884-6
State	Published - Apr 15 2002

Keywords

Atom probe
Ball milling
Cu-Ag
Nanocomposites

ASJC Scopus subject areas

General Materials Science

Online availability

10.1016/S0921-5093(01)01884-6

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title = "A new approach to preparing tips for atom probe field ion microscopy from powder materials",

abstract = "A new approach to preparing tips for atom probe field ion microscopy from powder materials is described. It is especially useful for particle sizes exceeding > 0.050 mm. Particles resulting from mechanical alloying of Cu and Ag, and from cryomilling of conventional Ni powders have been prepared this way for field ion imaging and atom probe composition analysis. In both cases, useful information complementing results from transmission electron microscopy and X-ray diffraction was obtained.",

keywords = "Atom probe, Ball milling, Cu-Ag, Nanocomposites",

author = "Fang Wu and P. Bellon and Lau, {M. L.} and Lavernia, {E. J.} and Lusby, {T. A.} and Melmed, {A. J.}",

note = "Funding Information: The authors wish to acknowledge financial support for this work by the National Science Foundation, Grant no. DMR-9733582 and by the Office of Naval Research, Grant no. N00014-97-1-0559, N00014-98-1-0569, N00014-01-1-0882 and N00014-00-1-0109.",

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doi = "10.1016/S0921-5093(01)01884-6",

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T1 - A new approach to preparing tips for atom probe field ion microscopy from powder materials

AU - Wu, Fang

AU - Bellon, P.

AU - Lau, M. L.

AU - Lavernia, E. J.

AU - Lusby, T. A.

AU - Melmed, A. J.

N1 - Funding Information: The authors wish to acknowledge financial support for this work by the National Science Foundation, Grant no. DMR-9733582 and by the Office of Naval Research, Grant no. N00014-97-1-0559, N00014-98-1-0569, N00014-01-1-0882 and N00014-00-1-0109.

PY - 2002/4/15

Y1 - 2002/4/15

N2 - A new approach to preparing tips for atom probe field ion microscopy from powder materials is described. It is especially useful for particle sizes exceeding > 0.050 mm. Particles resulting from mechanical alloying of Cu and Ag, and from cryomilling of conventional Ni powders have been prepared this way for field ion imaging and atom probe composition analysis. In both cases, useful information complementing results from transmission electron microscopy and X-ray diffraction was obtained.

AB - A new approach to preparing tips for atom probe field ion microscopy from powder materials is described. It is especially useful for particle sizes exceeding > 0.050 mm. Particles resulting from mechanical alloying of Cu and Ag, and from cryomilling of conventional Ni powders have been prepared this way for field ion imaging and atom probe composition analysis. In both cases, useful information complementing results from transmission electron microscopy and X-ray diffraction was obtained.

KW - Atom probe

KW - Ball milling

KW - Cu-Ag

KW - Nanocomposites

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A new approach to preparing tips for atom probe field ion microscopy from powder materials

Abstract

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