A multiscale model of rate dependence of nanocrystalline thin films

Fernando V. Stump, Nikhil Karanjgaokar, Philippe H Geubelle, Ioannis Chasiotis

Research output: Contribution to journalArticlepeer-review

Abstract

The rate dependence of nanocrystalline thin films is modeled as the competition between two microstructural deformation mechanisms: intra-granular crystal plasticity and inter-granular diffusion-based grain-boundary sliding. The analysis is conducted within the framework of a multiscale finite-element scheme based on the mathematical theory of homogenization. The key parameters entering the description of the grain interior and grain boundary models are calibrated through comparison with high strain rate tensile tests and creep experiments, respectively. The prediction of the viscoplastic response of gold thin films is validated against tensile test measurements obtained over seven decades of strain rate. The relative contribution of the microstructural damage mechanisms is analyzed.

Original languageEnglish (US)
Pages (from-to)441-459
Number of pages19
JournalInternational Journal for Multiscale Computational Engineering
Volume10
Issue number5
DOIs
StatePublished - Aug 30 2012

Keywords

  • Grain boundary modeling
  • Nanocrystalline materials
  • Rate dependence
  • Single crystal plasticity
  • Stress driven homogenization

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Computational Mechanics
  • Computer Networks and Communications

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