A multi-graph spectral framework for mining multi-source anomalies

Jing Gao, Nan Du, Wei Fan, Deepak Turaga, Srinivasan Parthasarathy, Jiawei Han

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Anomaly detection refers to the task of detecting objects whose characteristics deviate significantly from the majority of the data [5]. It is widely used in a variety of domains, such as intrusion detection, fraud detection, and health monitoring. Today's information explosion generates significant challenges for anomaly detection when there exist many large, distributed data repositories consisting of a variety of data sources and formats.

Original languageEnglish (US)
Title of host publicationGraph Embedding for Pattern Analysis
PublisherSpringer New York
Pages205-227
Number of pages23
ISBN (Electronic)9781461444572
ISBN (Print)9781461444565
DOIs
StatePublished - Jan 1 2013

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Intrusion detection
Explosions
Health
Monitoring

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Gao, J., Du, N., Fan, W., Turaga, D., Parthasarathy, S., & Han, J. (2013). A multi-graph spectral framework for mining multi-source anomalies. In Graph Embedding for Pattern Analysis (pp. 205-227). Springer New York. https://doi.org/10.1007/978-1-4614-4457-2_9

A multi-graph spectral framework for mining multi-source anomalies. / Gao, Jing; Du, Nan; Fan, Wei; Turaga, Deepak; Parthasarathy, Srinivasan; Han, Jiawei.

Graph Embedding for Pattern Analysis. Springer New York, 2013. p. 205-227.

Research output: Chapter in Book/Report/Conference proceedingChapter

Gao, J, Du, N, Fan, W, Turaga, D, Parthasarathy, S & Han, J 2013, A multi-graph spectral framework for mining multi-source anomalies. in Graph Embedding for Pattern Analysis. Springer New York, pp. 205-227. https://doi.org/10.1007/978-1-4614-4457-2_9
Gao J, Du N, Fan W, Turaga D, Parthasarathy S, Han J. A multi-graph spectral framework for mining multi-source anomalies. In Graph Embedding for Pattern Analysis. Springer New York. 2013. p. 205-227 https://doi.org/10.1007/978-1-4614-4457-2_9
Gao, Jing ; Du, Nan ; Fan, Wei ; Turaga, Deepak ; Parthasarathy, Srinivasan ; Han, Jiawei. / A multi-graph spectral framework for mining multi-source anomalies. Graph Embedding for Pattern Analysis. Springer New York, 2013. pp. 205-227
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