A Monte Carlo simulation environment for wear out in VLSI systems

Keyphrases

• Monte Carlo Simulation 100%
• Simulation Environment 100%
• VLSI Systems 100%
• Electromigration 50%
• Failure Time 50%
• Control Applications 50%
• Reliability Prediction 50%
• Chip-level 50%
• Microprocessor 50%
• Wearout 50%
• Switching Activity 50%
• Switch Level 50%
• VLSI Design 50%
• Trace Data 50%

Engineering

• Simulation Environment 100%
• Microprocessor Chips 50%
• Electromigration 50%
• Reliability Prediction 50%
• Level Switch 50%
• Switching Activity 50%