A molybdenum disulfide piezoelectric strain gauge

Adam M. Hurst, Daniel Chenet, Arend Van Der Zande, Ioannis Kymissis, James Hone

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This work experimentally probes and demonstrates the piezoelectric properties of single-atomic-layer MoS2. MoS2 devices were fabricated on a thin amorphous fused silica substrate, which was bonded to the high-stress location of a tuning fork to maximize the strain and resulting piezoelectric output. The dynamic strain was simultaneously measured in-situ with a commercial semiconductor strain gauge. This strain characterization technique allows us to dynamically strain MoS2 at a set frequency with maximum peak-to-peak strain levels up to 500 μϵ (0.05%). We thus correlate piezoelectric output from the MoS2 sensor with the applied dynamic strain.

Original languageEnglish (US)
Title of host publicationIEEE-NANO 2015 - 15th International Conference on Nanotechnology
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1122-1125
Number of pages4
ISBN (Electronic)9781467381550
DOIs
StatePublished - Jan 1 2015
Event15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 - Rome, Italy
Duration: Jul 27 2015Jul 30 2015

Publication series

NameIEEE-NANO 2015 - 15th International Conference on Nanotechnology

Other

Other15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015
CountryItaly
CityRome
Period7/27/157/30/15

Fingerprint

Strain gages
Molybdenum
Fused silica
molybdenum disulfide
Tuning
Semiconductor materials
Sensors
Substrates

Keywords

  • Molybdenum disulfide
  • dynamic strain gauge
  • piezoelectricity
  • strain
  • tuning fork

ASJC Scopus subject areas

  • Process Chemistry and Technology
  • Electrical and Electronic Engineering
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films

Cite this

Hurst, A. M., Chenet, D., Van Der Zande, A., Kymissis, I., & Hone, J. (2015). A molybdenum disulfide piezoelectric strain gauge. In IEEE-NANO 2015 - 15th International Conference on Nanotechnology (pp. 1122-1125). [7388821] (IEEE-NANO 2015 - 15th International Conference on Nanotechnology). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NANO.2015.7388821

A molybdenum disulfide piezoelectric strain gauge. / Hurst, Adam M.; Chenet, Daniel; Van Der Zande, Arend; Kymissis, Ioannis; Hone, James.

IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., 2015. p. 1122-1125 7388821 (IEEE-NANO 2015 - 15th International Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hurst, AM, Chenet, D, Van Der Zande, A, Kymissis, I & Hone, J 2015, A molybdenum disulfide piezoelectric strain gauge. in IEEE-NANO 2015 - 15th International Conference on Nanotechnology., 7388821, IEEE-NANO 2015 - 15th International Conference on Nanotechnology, Institute of Electrical and Electronics Engineers Inc., pp. 1122-1125, 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015, Rome, Italy, 7/27/15. https://doi.org/10.1109/NANO.2015.7388821
Hurst AM, Chenet D, Van Der Zande A, Kymissis I, Hone J. A molybdenum disulfide piezoelectric strain gauge. In IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc. 2015. p. 1122-1125. 7388821. (IEEE-NANO 2015 - 15th International Conference on Nanotechnology). https://doi.org/10.1109/NANO.2015.7388821
Hurst, Adam M. ; Chenet, Daniel ; Van Der Zande, Arend ; Kymissis, Ioannis ; Hone, James. / A molybdenum disulfide piezoelectric strain gauge. IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 1122-1125 (IEEE-NANO 2015 - 15th International Conference on Nanotechnology).
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