A microcontroller-based failsafe for single photon counting modules

Matthew P. Gordon, Paul R Selvin

Research output: Contribution to journalArticle

Abstract

A study was performed on a microcontroller-based failsafe for single photon counting modules (SPCM). The exposure to excessive light levels could damage the avalanche photodiode-based SPCM. The time response of the failsafe was tested by focusing a laser into a confocal microscope and onto a fluorescent sample.

Original languageEnglish (US)
Pages (from-to)1150-1152
Number of pages3
JournalReview of Scientific Instruments
Volume74
Issue number2
DOIs
StatePublished - Feb 1 2003

ASJC Scopus subject areas

  • Instrumentation

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