A microcontroller-based failsafe for single photon counting modules

Matthew P. Gordon; Paul R. Selvin

doi:10.1063/1.1531825

A microcontroller-based failsafe for single photon counting modules

Research output: Contribution to journal › Article › peer-review

Abstract

A study was performed on a microcontroller-based failsafe for single photon counting modules (SPCM). The exposure to excessive light levels could damage the avalanche photodiode-based SPCM. The time response of the failsafe was tested by focusing a laser into a confocal microscope and onto a fluorescent sample.

Original language	English (US)
Pages (from-to)	1150-1152
Number of pages	3
Journal	Review of Scientific Instruments
Volume	74
Issue number	2
DOIs	https://doi.org/10.1063/1.1531825
State	Published - Feb 2003

ASJC Scopus subject areas

Instrumentation

Online availability

10.1063/1.1531825

Library availability

Discover UIUC Full Text

Cite this

@article{464e0fb2d60845618d880db625a78390,

title = "A microcontroller-based failsafe for single photon counting modules",

abstract = "A study was performed on a microcontroller-based failsafe for single photon counting modules (SPCM). The exposure to excessive light levels could damage the avalanche photodiode-based SPCM. The time response of the failsafe was tested by focusing a laser into a confocal microscope and onto a fluorescent sample.",

author = "Gordon, {Matthew P.} and Selvin, {Paul R.}",

year = "2003",

month = feb,

doi = "10.1063/1.1531825",

language = "English (US)",

volume = "74",

pages = "1150--1152",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

number = "2",

}

TY - JOUR

T1 - A microcontroller-based failsafe for single photon counting modules

AU - Gordon, Matthew P.

AU - Selvin, Paul R.

PY - 2003/2

Y1 - 2003/2

N2 - A study was performed on a microcontroller-based failsafe for single photon counting modules (SPCM). The exposure to excessive light levels could damage the avalanche photodiode-based SPCM. The time response of the failsafe was tested by focusing a laser into a confocal microscope and onto a fluorescent sample.

AB - A study was performed on a microcontroller-based failsafe for single photon counting modules (SPCM). The exposure to excessive light levels could damage the avalanche photodiode-based SPCM. The time response of the failsafe was tested by focusing a laser into a confocal microscope and onto a fluorescent sample.

UR - http://www.scopus.com/inward/record.url?scp=0037330132&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037330132&partnerID=8YFLogxK

U2 - 10.1063/1.1531825

DO - 10.1063/1.1531825

M3 - Article

AN - SCOPUS:0037330132

SN - 0034-6748

VL - 74

SP - 1150

EP - 1152

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 2

ER -

A microcontroller-based failsafe for single photon counting modules

Abstract

ASJC Scopus subject areas

Online availability

Library availability

Related links

Fingerprint

Cite this