A methodology for expedient analysis of the impact of disorder in periodic waveguides

Juan S. Ochoa, Andreas C. Cangellaris

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An expedient methodology is presented for the predictive analysis of the impact of statistical disorder on the electromagnetic attributes of periodic waveguides. The proposed methodology makes use of ideas from the Anderson localization theory to derive closed-form expressions for the calculation of an effective exponential decay ratio that quantifies the impact of periodicity disorder on the transmission properties of the waveguide. The computational efficiency of the proposed method over Monte Carlo based alternatives is demonstrated through a specific example involving a periodically-loaded parallel plate waveguide.

Original languageEnglish (US)
Title of host publicationIMS 2012 - 2012 IEEE MTT-S International Microwave Symposium
DOIs
StatePublished - Oct 3 2012
Event2012 IEEE MTT-S International Microwave Symposium, IMS 2012 - Montreal, QC, Canada
Duration: Jun 17 2012Jun 22 2012

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
ISSN (Print)0149-645X

Other

Other2012 IEEE MTT-S International Microwave Symposium, IMS 2012
CountryCanada
CityMontreal, QC
Period6/17/126/22/12

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Keywords

  • Disorder
  • Finite element method
  • Localization
  • Monte Carlo analysis
  • Periodic structure

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Ochoa, J. S., & Cangellaris, A. C. (2012). A methodology for expedient analysis of the impact of disorder in periodic waveguides. In IMS 2012 - 2012 IEEE MTT-S International Microwave Symposium [6259425] (IEEE MTT-S International Microwave Symposium Digest). https://doi.org/10.1109/MWSYM.2012.6259425