A method for modeling the impact of conductor surface roughness on waveguiding properties of interconnects

Keyphrases

• Waveguiding Properties 100%
• Electromagnetic Analysis 100%
• Conductor Surface Roughness 100%
• Proposed Methodology 50%
• Frequency Dependence 50%
• Surface Roughness 50%
• Measure Data 50%
• Rough Surface 50%
• Conductor Model 50%
• Propagation Characteristics 50%
• Microstrip Transmission Line 50%
• Electromagnetic Field Solver 50%
• High-speed Interconnects 50%
• Transmission Line Structures 50%
• Surface Conductor 50%
• Conductor Cross-section 50%

Engineering

• Interconnects 100%
• Electromagnetic Analysis 66%
• Cross Section 33%
• Measurement Data 33%
• Outer Layer 33%
• Electric Lines 33%
• Propagation Characteristic 33%

Material Science

• Conductor 100%
• Surface Roughness 100%
• Rough Surface 20%