A method for determining the severity of sudden death syndrome in soybeans

D. Cui, Q. Zhang, M. Li, T. Slaminko, G. L. Hartman

Research output: Contribution to journalArticlepeer-review


Sudden death syndrome (SDS), caused by the fungus Fusarium virguliforme, is a widespread mid- to late-season soybean disease with distinctive foliar symptoms that in some extreme cases may cause nearly 100% yield loss. This article reports on the development of an image analysis method to quantify SDS severity using an RGB camera under natural light in a laboratory environment. An HSI (hue, saturation, and intensity) color space based image processing approach was developed. A lesion index (LI) was defined as the ratio of affected leaf area to healthy area for evaluating SDS severity levels on leaves of infected plants. A method of using the frequency distribution of hue values of whole leaf area to measure the severity of SDS was also investigated. Preliminary results obtained from laboratory-scale validation demonstrated that the developed method could provide a feasible means of recording SDS severity in situ that could potentially be used for high-throughput greenhouse evaluation of breeding lines or commercial soybean cultivars.

Original languageEnglish (US)
Pages (from-to)671-678
Number of pages8
JournalTransactions of the ASABE
Issue number2
StatePublished - 2014


  • HSI
  • Image processing
  • Infection level
  • LI
  • Soybean
  • Sudden death syndrome

ASJC Scopus subject areas

  • Forestry
  • Food Science
  • Biomedical Engineering
  • Agronomy and Crop Science
  • Soil Science


Dive into the research topics of 'A method for determining the severity of sudden death syndrome in soybeans'. Together they form a unique fingerprint.

Cite this