@inproceedings{69853f9563c24d9e8a6da0dfd4439a84,
title = "A mechanism for logic upset induced by power-on ESD",
abstract = "Logic upset caused by contact discharge is studied using a test chip mounted on a board. Upset can be triggered by a parasitic NPN structure which couples the ESD protection to an N+ diffusion in the core circuitry. Upset often involves contention and thus is sensitive to transistor sizing.",
author = "Yang Xiu and Nicholas Thomson and Robert Mertens and Elyse Rosenbaum",
year = "2014",
month = nov,
day = "26",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
number = "November",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2014",
edition = "November",
note = "36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 ; Conference date: 07-09-2014 Through 12-09-2014",
}