Abstract
The small-signal equivalent circuit of AlGaN/GaN high electron-mobility transistors is discussed. A new modeling procedure is introduced in this paper that does not bias the device at a untenable high gate voltage in order to extract the parasitic inductance and resistance. Simulated results show good agreement with measurements up to 40 GHz.
| Original language | English (US) |
|---|---|
| Article number | 1650433 |
| Pages (from-to) | 2949-2952 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 54 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 2006 |
| Externally published | Yes |
Keywords
- Gallium-nitride (GaN) high electron-mobility transistor (HEMT)
- Small-signal modeling
ASJC Scopus subject areas
- Radiation
- Condensed Matter Physics
- Electrical and Electronic Engineering