TY - GEN
T1 - A hybrid method for quantitative statistical analysis of in-situ IC and electronics in complex and wave-chaotic enclosures
AU - Lin, Shen
AU - Peng, Zhen
AU - Antonsen, Thomas
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/11/3
Y1 - 2016/11/3
N2 - This research concerns with a quantitative statistical characterization of IC and electronic systems in large complicated enclosures. The objective is to identify, quantify, predict and characterize the in-situ performance of IC electronics housed inside the enclosure of interest, such as a room, aircraft fuselage, or computer box. A novel hybrid deterministic and stochastic formulation is proposed, in which small electronic components (circuits, packages, PCBs, etc.) in the computational domain are modeled using first-principles and large portions (cavity enclosures) are modeled statistically. The capability and benefits of the computation algorithms are exploited, illustrated and validated through representative product-level IC and electronic systems.
AB - This research concerns with a quantitative statistical characterization of IC and electronic systems in large complicated enclosures. The objective is to identify, quantify, predict and characterize the in-situ performance of IC electronics housed inside the enclosure of interest, such as a room, aircraft fuselage, or computer box. A novel hybrid deterministic and stochastic formulation is proposed, in which small electronic components (circuits, packages, PCBs, etc.) in the computational domain are modeled using first-principles and large portions (cavity enclosures) are modeled statistically. The capability and benefits of the computation algorithms are exploited, illustrated and validated through representative product-level IC and electronic systems.
UR - http://www.scopus.com/inward/record.url?scp=85006699533&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85006699533&partnerID=8YFLogxK
U2 - 10.1109/PIERS.2016.7735029
DO - 10.1109/PIERS.2016.7735029
M3 - Conference contribution
AN - SCOPUS:85006699533
T3 - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings
SP - 2503
EP - 2510
BT - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016
Y2 - 8 August 2016 through 11 August 2016
ER -