Keyphrases
Micro-electro-mechanical Systems
100%
MEMS Devices
100%
Numerical Investigation
100%
Dynamic Loading
100%
Modified Split Hopkinson Pressure Bar (M-SHPB)
50%
Numerical Simulation
25%
Silicon Dioxide
25%
Finite Element Simulation
25%
Temporal Profile
25%
Mechanical Response
25%
Amplitude Profiles
25%
High-speed Imaging
25%
Failure Time
25%
Cantilever Beam
25%
Metal Electrode
25%
Time-image
25%
Failure Stress
25%
Failure Event
25%
System Structure
25%
Multilayer Beam
25%
PZT Film
25%
Material Layer
25%
Failure Initiation
25%
Load Amplitude
25%
Multilayered Beam
25%
Elastic Layer
25%
Engineering
Microelectromechanical System
100%
Dynamic Loads
100%
Mem Device
100%
Experimental Measurement
50%
Split Hopkinson Pressure Bar
50%
Finite Element Simulation
25%
Computer Simulation
25%
Mechanical Response
25%
Cantilever Beam
25%
Failure Stress
25%
Failure Event
25%
System Structure
25%
Material Layer
25%
Failure Initiation
25%
Material Science
Microelectromechanical System
100%
Dynamic Loads
100%
Finite Element Method
25%
Silicon Dioxide
25%
Film
25%