TY - GEN
T1 - A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology
AU - Huang, Shudong
AU - Parthasarathy, Srivatsan
AU - Zhou, Yuanzhong Paul
AU - Hajjar, Jean Jacques
AU - Rosenbaum, Elyse
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - This work presents a high voltage tolerant (HVT) supply clamp for ESD protection, in which the current drive of the clamp during an ESD event is maximized without compromising reliability during normal operation. Similar to prior HVT clamps, ESD current shunting is provided by 3 cascoded NFETs but the novel trigger circuit optimizes the gate bias. The design is implemented in a 45-nm SOI CMOS technology and the clamp devices are sized for a 2-kV HBM protection level. As evidenced by TLP and VFTLP measurements, the new clamp offers 50% reduction of on-resistance and 0.6 V lower turn-on voltage, relative to the prior art.
AB - This work presents a high voltage tolerant (HVT) supply clamp for ESD protection, in which the current drive of the clamp during an ESD event is maximized without compromising reliability during normal operation. Similar to prior HVT clamps, ESD current shunting is provided by 3 cascoded NFETs but the novel trigger circuit optimizes the gate bias. The design is implemented in a 45-nm SOI CMOS technology and the clamp devices are sized for a 2-kV HBM protection level. As evidenced by TLP and VFTLP measurements, the new clamp offers 50% reduction of on-resistance and 0.6 V lower turn-on voltage, relative to the prior art.
KW - CMOS
KW - Supply clamp
KW - electrostatic discharge
UR - http://www.scopus.com/inward/record.url?scp=85130743856&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85130743856&partnerID=8YFLogxK
U2 - 10.1109/IRPS48227.2022.9764514
DO - 10.1109/IRPS48227.2022.9764514
M3 - Conference contribution
AN - SCOPUS:85130743856
T3 - IEEE International Reliability Physics Symposium Proceedings
SP - 5C31-5C36
BT - 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 IEEE International Reliability Physics Symposium, IRPS 2022
Y2 - 27 March 2022 through 31 March 2022
ER -