A High-Sensitivity Benchtop X-Ray Fluorescence Emission Tomography (XFET) System With a Full-Ring of X-Ray Imaging-Spectrometers and a Compound-Eye Collimation Aperture
Shubham Mandot, Elena M. Zannoni, Ling Cai, Xingchen Nie, Patrick J.La Riviere, Matthew D. Wilson, Ling Jian Meng
Research output: Contribution to journal › Article › peer-review
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