A high-order SAR model for multiple transmitters in portable devices

Jian Li, Su Yan, Yanan Liu, Jian Ming Jin, Bertrand M. Hochwald

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In order to estimate the electromagnetic exposure under multi-antenna transmitters installed in portable devices, a low-order specific absorption rate (SAR) model is generalized to higher orders based on the Fourier series expansion for fast and accurate evaluation and prediction of SAR values as a function of phase differences among multiple transmitters. Numerical and experimental examples are given to demonstrate the effectiveness of the proposed high-order SAR model in LTE communication bands.

Original languageEnglish (US)
Title of host publication2017 IEEE Antennas and Propagation Society International Symposium, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages221-222
Number of pages2
ISBN (Electronic)9781538632840
DOIs
StatePublished - Oct 18 2017
Event2017 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2017 - San Diego, United States
Duration: Jul 9 2017Jul 14 2017

Publication series

Name2017 IEEE Antennas and Propagation Society International Symposium, Proceedings
Volume2017-January

Other

Other2017 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2017
CountryUnited States
CitySan Diego
Period7/9/177/14/17

Keywords

  • High-order model
  • LTE communication
  • Multiantenna transmitter
  • Portable devices
  • Specific absorption rate

ASJC Scopus subject areas

  • Radiation
  • Computer Networks and Communications
  • Instrumentation

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  • Cite this

    Li, J., Yan, S., Liu, Y., Jin, J. M., & Hochwald, B. M. (2017). A high-order SAR model for multiple transmitters in portable devices. In 2017 IEEE Antennas and Propagation Society International Symposium, Proceedings (pp. 221-222). (2017 IEEE Antennas and Propagation Society International Symposium, Proceedings; Vol. 2017-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APUSNCURSINRSM.2017.8072153