A general cache framework for efficient generation of timing critical paths

Kuan Ming Lai, Tsung Wei Huang, Tsung Yi Ho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The recent TAU 2018 contest was seeking novel idea for efficient generation of timing reports. When the timing graph is updated, users query different forms of timing reports that happen subsequently and sequentially. This process is computationally expensive and inherently complex. Therefore, we introduce in this paper a general cache framework for efficient generation of timing critical paths. Our framework efficiently supports (1) a cache scheme to minimize duplicate calculation, (2) graph contraction to reduce the search space, and (3) multi-threading. We evaluated our framework on the TAU 2018 contest benchmarks and demonstrated promising performance over the top performer.

Original languageEnglish (US)
Title of host publicationProceedings of the 56th Annual Design Automation Conference 2019, DAC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781450367257
DOIs
StatePublished - Jun 2 2019
Event56th Annual Design Automation Conference, DAC 2019 - Las Vegas, United States
Duration: Jun 2 2019Jun 6 2019

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Conference

Conference56th Annual Design Automation Conference, DAC 2019
CountryUnited States
CityLas Vegas
Period6/2/196/6/19

Keywords

  • Cache
  • Path-based Timing Analysis
  • Static Timing Analysis

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

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  • Cite this

    Lai, K. M., Huang, T. W., & Ho, T. Y. (2019). A general cache framework for efficient generation of timing critical paths. In Proceedings of the 56th Annual Design Automation Conference 2019, DAC 2019 [a108] (Proceedings - Design Automation Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/3316781.3317744