TY - GEN
T1 - A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting
AU - Mertens, Robert
AU - Kunz, Hans
AU - Salman, Akram
AU - Boselli, Gianluca
AU - Rosenbaum, Elyse
PY - 2012
Y1 - 2012
N2 - A new simulation model, emphasizing integrated circuit testing applications, is proposed for contract discharge from an ESD gun, such as those used for IEC 61000-4-2 and ISO 10605 system-level ESD qualification. Waveforms from simulation are compared with the IEC-61000-4-2 waveform specification and reference waveform. An example application of the model is also presented.
AB - A new simulation model, emphasizing integrated circuit testing applications, is proposed for contract discharge from an ESD gun, such as those used for IEC 61000-4-2 and ISO 10605 system-level ESD qualification. Waveforms from simulation are compared with the IEC-61000-4-2 waveform specification and reference waveform. An example application of the model is also presented.
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M3 - Conference contribution
AN - SCOPUS:84869814150
SN - 1585372188
SN - 9781585372188
T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
BT - Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012
T2 - 34th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2012
Y2 - 9 September 2012 through 14 September 2012
ER -