A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting

Robert Mertens, Hans Kunz, Akram Salman, Gianluca Boselli, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new simulation model, emphasizing integrated circuit testing applications, is proposed for contract discharge from an ESD gun, such as those used for IEC 61000-4-2 and ISO 10605 system-level ESD qualification. Waveforms from simulation are compared with the IEC-61000-4-2 waveform specification and reference waveform. An example application of the model is also presented.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012
StatePublished - Nov 27 2012
Event34th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2012 - Tucson, AZ, United States
Duration: Sep 9 2012Sep 14 2012

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159

Other

Other34th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2012
CountryUnited States
CityTucson, AZ
Period9/9/129/14/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Mertens, R., Kunz, H., Salman, A., Boselli, G., & Rosenbaum, E. (2012). A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012 [6333331] (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).