A dual-base triggered SCR with very low leakage current and adjustable trigger voltage

James Di Sarro; Vladislav Vashchenko; Elyse Rosenbaum; Peter Hopper

A dual-base triggered SCR with very low leakage current and adjustable trigger voltage

James Di Sarro, Vladislav Vashchenko, Elyse Rosenbaum, Peter Hopper

Research output: Contribution to journal › Conference article › peer-review

Abstract

A new dual-base triggered SCR is presented. By adjusting the device sizings in the trigger circuit, the designer sets the trigger voltage to an application-appropriate value. The turn-on time is comparable to that of DTSCRs fabricated in the same technology node, but the leakage is orders of magnitude lower.

Original language	English (US)
Article number	4772140
Pages (from-to)	242-248
Number of pages	7
Journal	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
State	Published - 2008
Event	2008 30th Annual on Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2008 - Tucson, AZ, United States Duration: Sep 7 2008 → Sep 12 2008

ASJC Scopus subject areas

Electrical and Electronic Engineering

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@article{595e48fcc0f54c83beabef01f37ae1df,

title = "A dual-base triggered SCR with very low leakage current and adjustable trigger voltage",

abstract = "A new dual-base triggered SCR is presented. By adjusting the device sizings in the trigger circuit, the designer sets the trigger voltage to an application-appropriate value. The turn-on time is comparable to that of DTSCRs fabricated in the same technology node, but the leakage is orders of magnitude lower.",

author = "Sarro, {James Di} and Vladislav Vashchenko and Elyse Rosenbaum and Peter Hopper",

year = "2008",

language = "English (US)",

pages = "242--248",

journal = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",

issn = "0739-5159",

note = "2008 30th Annual on Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2008 ; Conference date: 07-09-2008 Through 12-09-2008",

}

TY - JOUR

T1 - A dual-base triggered SCR with very low leakage current and adjustable trigger voltage

AU - Sarro, James Di

AU - Vashchenko, Vladislav

AU - Rosenbaum, Elyse

AU - Hopper, Peter

PY - 2008

Y1 - 2008

N2 - A new dual-base triggered SCR is presented. By adjusting the device sizings in the trigger circuit, the designer sets the trigger voltage to an application-appropriate value. The turn-on time is comparable to that of DTSCRs fabricated in the same technology node, but the leakage is orders of magnitude lower.

AB - A new dual-base triggered SCR is presented. By adjusting the device sizings in the trigger circuit, the designer sets the trigger voltage to an application-appropriate value. The turn-on time is comparable to that of DTSCRs fabricated in the same technology node, but the leakage is orders of magnitude lower.

UR - http://www.scopus.com/inward/record.url?scp=66649086239&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=66649086239&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:66649086239

SN - 0739-5159

SP - 242

EP - 248

JO - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

JF - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

M1 - 4772140

T2 - 2008 30th Annual on Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2008

Y2 - 7 September 2008 through 12 September 2008

ER -

A dual-base triggered SCR with very low leakage current and adjustable trigger voltage

Abstract

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