A dual-base triggered SCR with very low leakage current and adjustable trigger voltage

James Di Sarro, Vladislav Vashchenko, Elyse Rosenbaum, Peter Hopper

Research output: Contribution to journalConference article

Abstract

A new dual-base triggered SCR is presented. By adjusting the device sizings in the trigger circuit, the designer sets the trigger voltage to an application-appropriate value. The turn-on time is comparable to that of DTSCRs fabricated in the same technology node, but the leakage is orders of magnitude lower.

Original languageEnglish (US)
Article number4772140
Pages (from-to)242-248
Number of pages7
JournalElectrical Overstress/Electrostatic Discharge Symposium Proceedings
StatePublished - Dec 1 2008
Event2008 30th Annual on Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2008 - Tucson, AZ, United States
Duration: Sep 7 2008Sep 12 2008

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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