Abstract
This paper presents a digital background calibration technique to realize a linear voltage-controlled-oscillator (VCO) based ADC. The distortion caused due to the VCO's nonlinear tuning characteristics is eliminated by introducing an inverse voltage-to-frequency transfer function in the signal path. The proposed calibration unit runs in the background and detects the inverse transfer function using a highly digital frequency locked loop. Like many other VCO-based ADCs, the proposed technique does not require analog building blocks such as operational amplifiers, multi-bit feed-back DACs etc., and retains the scaling friendly properties. Implemented in a 90 nm CMOS process, the on-chip calibration improves SNDR of an open-loop VCO-based ADC from 46 dB to more than 73 dB in 5 MHz signal bandwidth while consuming 4.1 mW power. The ADC achieves a figure-of-merit of 91-112 fJ/conv-step for different input frequencies.
| Original language | English (US) |
|---|---|
| Article number | 6712154 |
| Pages (from-to) | 950-960 |
| Number of pages | 11 |
| Journal | IEEE Journal of Solid-State Circuits |
| Volume | 49 |
| Issue number | 4 |
| DOIs | |
| State | Published - Apr 2014 |
Keywords
- Background calibration
- VCO based ADC
- calibration
- deterministic calibration
- open-loop delta sigma
- time based ADC
ASJC Scopus subject areas
- Electrical and Electronic Engineering