A comprehensive electromagnetic model for transient analysis of on-chip noise generation and coupling

J. Y. Ihm, I. J. Chung, G. Manetas, Andreas C Cangellaris

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A methodology is described for the comprehensive modeling and simulation of on-chip electrical noise generation and coupling, and its impact on signal transmission integrity and power delivery stability. The emphasis is on ensuring uncompromised electromagnetic accuracy in the development of the model, while at the same time maintaining compatibility with the SPICE-based, nonlinear transient simulation environment pervasive in modern IC design flow.

Original languageEnglish (US)
Title of host publicationICEAA 2005 - 9th International Conference on Electromagnetics in Advanced Applications and EESC 2005 - 11th European Electromagnetic Structures Conference
Pages987-990
Number of pages4
StatePublished - 2005
EventJoint 9th International Conference on Electromagnetics in Advanced Applications, ICEAA 2005 and 11th European Electromagnetic Structures Conference, EESC 2005 - Torino, Italy
Duration: Sep 12 2005Sep 16 2005

Other

OtherJoint 9th International Conference on Electromagnetics in Advanced Applications, ICEAA 2005 and 11th European Electromagnetic Structures Conference, EESC 2005
CountryItaly
CityTorino
Period9/12/059/16/05

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

Fingerprint Dive into the research topics of 'A comprehensive electromagnetic model for transient analysis of on-chip noise generation and coupling'. Together they form a unique fingerprint.

  • Cite this

    Ihm, J. Y., Chung, I. J., Manetas, G., & Cangellaris, A. C. (2005). A comprehensive electromagnetic model for transient analysis of on-chip noise generation and coupling. In ICEAA 2005 - 9th International Conference on Electromagnetics in Advanced Applications and EESC 2005 - 11th European Electromagnetic Structures Conference (pp. 987-990)