Abstract
A methodology is described for the comprehensive modeling and simulation of on-chip electrical noise generation and coupling, and its impact on signal transmission integrity and power delivery stability. The emphasis is on ensuring uncompromised electromagnetic accuracy in the development of the model, while at the same time maintaining compatibility with the SPICE-based, nonlinear transient simulation environment pervasive in modern IC design flow.
| Original language | English (US) |
|---|---|
| Title of host publication | ICEAA 2005 - 9th International Conference on Electromagnetics in Advanced Applications and EESC 2005 - 11th European Electromagnetic Structures Conference |
| Pages | 987-990 |
| Number of pages | 4 |
| State | Published - 2005 |
| Event | Joint 9th International Conference on Electromagnetics in Advanced Applications, ICEAA 2005 and 11th European Electromagnetic Structures Conference, EESC 2005 - Torino, Italy Duration: Sep 12 2005 → Sep 16 2005 |
Other
| Other | Joint 9th International Conference on Electromagnetics in Advanced Applications, ICEAA 2005 and 11th European Electromagnetic Structures Conference, EESC 2005 |
|---|---|
| Country/Territory | Italy |
| City | Torino |
| Period | 9/12/05 → 9/16/05 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Radiation