Abstract
Metal-semiconductor-metal (MSM) photodiodes with interdigitated indium-tin-oxide (ITO) electrodes have been fabricated on undoped GaAs using reactive-ion-etching in a methane plasma. The responsivity of ITO-MSM’s is measured to be approximately 0.8 A/W, which is twice that of conventional Ti/Au-MSM’s under normal operational bias conditions at A = 850 nm. This higher responsivity is attributed to the transparency of the ITO electrodes. ITO-MSM’s exhibited a linear optical response over a wider bias range than Ti/Au-MSM’s. Also, a higher breakdown voltage was measured for ITO-MSM’s. The bandwidths of ITO and Ti/Au-MSM’s fabricated on the same semiconductor layer with 1 μm fingers and spaces were measured to be 6 and 9 GHz, respectively. The slower response of the ITO-MSM’s is due to the longer transit time of the carriers generated beneath the ITO electrodes.
Original language | English (US) |
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Pages (from-to) | 888-890 |
Number of pages | 3 |
Journal | IEEE Photonics Technology Letters |
Volume | 4 |
Issue number | 8 |
DOIs | |
State | Published - Aug 1992 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering