A compact, timed-shutoff, MOSFET-based power clamp for on-chip ESD protection

Junjun Li, Robert Gauthier, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a novel RC-triggered, MOSFET-based power clamp for on-chip ESD protection. The cascaded PFET feedback technique is introduced. As with other feedback techniques, only a very small time constant is required for the RC trigger circuit which results in reduced capacitor area and reduced leakage at power-up. If mistriggering occurs, it is self-corrected with this dynamic feedback technique.

Original languageEnglish (US)
Title of host publication2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04
DOIs
StatePublished - Dec 1 2004
Event2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04 - Grapevine, TX, United States
Duration: Sep 19 2004Sep 23 2004

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159

Other

Other2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04
CountryUnited States
CityGrapevine, TX
Period9/19/049/23/04

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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