TY - GEN
T1 - A compact, timed-shutoff, MOSFET-based power clamp for on-chip ESD protection
AU - Li, Junjun
AU - Gauthier, Robert
AU - Rosenbaum, Elyse
PY - 2004
Y1 - 2004
N2 - We present a novel RC-triggered, MOSFET-based power clamp for on-chip ESD protection. The cascaded PFET feedback technique is introduced. As with other feedback techniques, only a very small time constant is required for the RC trigger circuit which results in reduced capacitor area and reduced leakage at power-up. If mistriggering occurs, it is self-corrected with this dynamic feedback technique.
AB - We present a novel RC-triggered, MOSFET-based power clamp for on-chip ESD protection. The cascaded PFET feedback technique is introduced. As with other feedback techniques, only a very small time constant is required for the RC trigger circuit which results in reduced capacitor area and reduced leakage at power-up. If mistriggering occurs, it is self-corrected with this dynamic feedback technique.
UR - http://www.scopus.com/inward/record.url?scp=77950856271&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77950856271&partnerID=8YFLogxK
U2 - 10.1109/EOSESD.2004.5272597
DO - 10.1109/EOSESD.2004.5272597
M3 - Conference contribution
AN - SCOPUS:77950856271
SN - 1585370630
SN - 9781585370634
T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
BT - 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04
T2 - 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04
Y2 - 19 September 2004 through 23 September 2004
ER -