Abstract

A multiscale method combining atomistic and continuum regions is presented to predict the static response of Nanoelectromechanical (NEM) switches. The atomistic and continuum regions are combined by using a Schwartz technique with either overlapped subdomains and Dirichlet-Dirichlet type boundary conditions, or non-overlapped subdomains and Dirichlet-Neumann type boundary conditions. The continuum regions are treated by nonlinear elastic theories and the atomistic regions are treated by the molecular dynamics (MD) method. The accuracy of the multiscale approach is checked. by comparing results obtained with the MD technique for the entire device or geometry. Finally, the convergence behavior of the multiscale approach is investigated in detail.

Original languageEnglish (US)
Title of host publication2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings
PublisherIEEE Computer Society
Pages191-194
Number of pages4
ISBN (Electronic)0780379764
DOIs
StatePublished - Jan 1 2003
Event2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - San Francisco, United States
Duration: Aug 12 2003Aug 14 2003

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
Volume1
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380

Other

Other2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003
CountryUnited States
CitySan Francisco
Period8/12/038/14/03

Keywords

  • Bonding
  • Boundary conditions
  • Carbon nanotubes
  • Computational modeling
  • Convergence
  • Geometry
  • Nanoelectromechanical systems
  • Nonlinear equations
  • Stress
  • Switches

ASJC Scopus subject areas

  • Bioengineering
  • Electrical and Electronic Engineering
  • Materials Chemistry
  • Condensed Matter Physics

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  • Cite this

    Tang, Z., & Aluru, N. R. (2003). A combined atomistic/continuum analysis of nanoelectromechanical systems. In 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings (pp. 191-194). [1231748] (Proceedings of the IEEE Conference on Nanotechnology; Vol. 1). IEEE Computer Society. https://doi.org/10.1109/NANO.2003.1231748