A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS)

Y. Xu; G. Li; Narayana R Aluru

A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TEA analysis.

Original language	English (US)
Title of host publication	2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings
Editors	M. Laudon, B. Romanowicz
Pages	537-540
Number of pages	4
State	Published - Dec 1 2005
Event	2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 - Anaheim, CA, United States Duration: May 8 2005 → May 12 2005

Publication series

Name	2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings

Other

Other	2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005
Country	United States
City	Anaheim, CA
Period	5/8/05 → 5/12/05

Keywords

Coarse-grained method
Nanoelectromechanical systems (NEMS)
Tight binding

ASJC Scopus subject areas

Engineering(all)

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Xu, Y., Li, G., & Aluru, N. R. (2005). A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). In M. Laudon, & B. Romanowicz (Eds.), 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings (pp. 537-540). (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).

A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). / Xu, Y.; Li, G.; Aluru, Narayana R.

2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. ed. / M. Laudon; B. Romanowicz. 2005. p. 537-540 (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Xu, Y, Li, G & Aluru, NR 2005, A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). in M Laudon & B Romanowicz (eds), 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings, pp. 537-540, 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005, Anaheim, CA, United States, 5/8/05.

Xu Y, Li G, Aluru NR. A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). In Laudon M, Romanowicz B, editors, 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. 2005. p. 537-540. (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).

Xu, Y. ; Li, G. ; Aluru, Narayana R. / A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. editor / M. Laudon ; B. Romanowicz. 2005. pp. 537-540 (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).

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