A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS)

Y. Xu, G. Li, Narayana R Aluru

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TEA analysis.

Original languageEnglish (US)
Title of host publication2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings
EditorsM. Laudon, B. Romanowicz
Pages537-540
Number of pages4
StatePublished - Dec 1 2005
Event2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 - Anaheim, CA, United States
Duration: May 8 2005May 12 2005

Publication series

Name2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings

Other

Other2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005
CountryUnited States
CityAnaheim, CA
Period5/8/055/12/05

Fingerprint

NEMS
Electronic properties
Electrostatics
Costs

Keywords

  • Coarse-grained method
  • Nanoelectromechanical systems (NEMS)
  • Tight binding

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Xu, Y., Li, G., & Aluru, N. R. (2005). A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). In M. Laudon, & B. Romanowicz (Eds.), 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings (pp. 537-540). (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).

A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). / Xu, Y.; Li, G.; Aluru, Narayana R.

2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. ed. / M. Laudon; B. Romanowicz. 2005. p. 537-540 (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Xu, Y, Li, G & Aluru, NR 2005, A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). in M Laudon & B Romanowicz (eds), 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings, pp. 537-540, 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005, Anaheim, CA, United States, 5/8/05.
Xu Y, Li G, Aluru NR. A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). In Laudon M, Romanowicz B, editors, 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. 2005. p. 537-540. (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).
Xu, Y. ; Li, G. ; Aluru, Narayana R. / A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. editor / M. Laudon ; B. Romanowicz. 2005. pp. 537-540 (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).
@inproceedings{6a463c3badd24223aa1b69dc43bec9a7,
title = "A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS)",
abstract = "A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TEA analysis.",
keywords = "Coarse-grained method, Nanoelectromechanical systems (NEMS), Tight binding",
author = "Y. Xu and G. Li and Aluru, {Narayana R}",
year = "2005",
month = "12",
day = "1",
language = "English (US)",
isbn = "0976798522",
series = "2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings",
pages = "537--540",
editor = "M. Laudon and B. Romanowicz",
booktitle = "2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings",

}

TY - GEN

T1 - A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS)

AU - Xu, Y.

AU - Li, G.

AU - Aluru, Narayana R

PY - 2005/12/1

Y1 - 2005/12/1

N2 - A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TEA analysis.

AB - A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TEA analysis.

KW - Coarse-grained method

KW - Nanoelectromechanical systems (NEMS)

KW - Tight binding

UR - http://www.scopus.com/inward/record.url?scp=32044432866&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=32044432866&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:32044432866

SN - 0976798522

SN - 9780976798521

T3 - 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings

SP - 537

EP - 540

BT - 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings

A2 - Laudon, M.

A2 - Romanowicz, B.

ER -