Abstract
A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TEA analysis.
| Original language | English (US) |
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| Title of host publication | 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings |
| Editors | M. Laudon, B. Romanowicz |
| Pages | 537-540 |
| Number of pages | 4 |
| State | Published - Dec 1 2005 |
| Event | 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 - Anaheim, CA, United States Duration: May 8 2005 → May 12 2005 |
Publication series
| Name | 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings |
|---|
Other
| Other | 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 |
|---|---|
| Country | United States |
| City | Anaheim, CA |
| Period | 5/8/05 → 5/12/05 |
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Keywords
- Coarse-grained method
- Nanoelectromechanical systems (NEMS)
- Tight binding
ASJC Scopus subject areas
- Engineering(all)
Cite this
Xu, Y., Li, G., & Aluru, N. R. (2005). A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). In M. Laudon, & B. Romanowicz (Eds.), 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings (pp. 537-540). (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).