A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS)

Y. Xu, G. Li, Narayana R Aluru

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TEA analysis.

Original languageEnglish (US)
Title of host publication2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings
EditorsM. Laudon, B. Romanowicz
Pages537-540
Number of pages4
StatePublished - Dec 1 2005
Event2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 - Anaheim, CA, United States
Duration: May 8 2005May 12 2005

Publication series

Name2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings

Other

Other2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005
CountryUnited States
CityAnaheim, CA
Period5/8/055/12/05

Keywords

  • Coarse-grained method
  • Nanoelectromechanical systems (NEMS)
  • Tight binding

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Xu, Y., Li, G., & Aluru, N. R. (2005). A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). In M. Laudon, & B. Romanowicz (Eds.), 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings (pp. 537-540). (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).