Abstract
A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TEA analysis.
| Original language | English (US) |
|---|---|
| Title of host publication | 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings |
| Editors | M. Laudon, B. Romanowicz |
| Pages | 537-540 |
| Number of pages | 4 |
| State | Published - Dec 1 2005 |
| Event | 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 - Anaheim, CA, United States Duration: May 8 2005 → May 12 2005 |
Publication series
| Name | 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings |
|---|
Other
| Other | 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 |
|---|---|
| Country | United States |
| City | Anaheim, CA |
| Period | 5/8/05 → 5/12/05 |
Fingerprint
Keywords
- Coarse-grained method
- Nanoelectromechanical systems (NEMS)
- Tight binding
ASJC Scopus subject areas
- Engineering(all)
Cite this
A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS). / Xu, Y.; Li, G.; Aluru, Narayana R.
2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. ed. / M. Laudon; B. Romanowicz. 2005. p. 537-540 (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS)
AU - Xu, Y.
AU - Li, G.
AU - Aluru, Narayana R
PY - 2005/12/1
Y1 - 2005/12/1
N2 - A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TEA analysis.
AB - A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TEA analysis.
KW - Coarse-grained method
KW - Nanoelectromechanical systems (NEMS)
KW - Tight binding
UR - http://www.scopus.com/inward/record.url?scp=32044432866&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=32044432866&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:32044432866
SN - 0976798522
SN - 9780976798521
T3 - 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings
SP - 537
EP - 540
BT - 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings
A2 - Laudon, M.
A2 - Romanowicz, B.
ER -