A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry

Kuo Hsuan Meng; Alex Gerdemann; James W. Miller; Elyse Rosenbaum

A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry

Kuo Hsuan Meng, Alex Gerdemann, James W. Miller, Elyse Rosenbaum

Research output: Contribution to journal › Conference article › peer-review

Abstract

The proposed co-design methodology simultaneously optimizes the ESD robustness and functionality of I/O circuitry. The methodology formulates an equivalent optimization problem so that the ESD and I/O driver networks can be optimized without a priori knowledge of peripheral pre-driver circuitry.

Original language	English (US)
Journal	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume	2014-November
Issue number	November
State	Published - Nov 26 2014
Event	36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 - Tucson, United States Duration: Sep 7 2014 → Sep 12 2014

ASJC Scopus subject areas

Electrical and Electronic Engineering

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@article{20f2f5b63b834b85b4547105d8532acc,

title = "A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry",

abstract = "The proposed co-design methodology simultaneously optimizes the ESD robustness and functionality of I/O circuitry. The methodology formulates an equivalent optimization problem so that the ESD and I/O driver networks can be optimized without a priori knowledge of peripheral pre-driver circuitry.",

author = "Meng, {Kuo Hsuan} and Alex Gerdemann and Miller, {James W.} and Elyse Rosenbaum",

year = "2014",

month = nov,

day = "26",

language = "English (US)",

volume = "2014-November",

journal = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",

issn = "0739-5159",

number = "November",

note = "36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 ; Conference date: 07-09-2014 Through 12-09-2014",

}

TY - JOUR

T1 - A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry

AU - Meng, Kuo Hsuan

AU - Gerdemann, Alex

AU - Miller, James W.

AU - Rosenbaum, Elyse

PY - 2014/11/26

Y1 - 2014/11/26

N2 - The proposed co-design methodology simultaneously optimizes the ESD robustness and functionality of I/O circuitry. The methodology formulates an equivalent optimization problem so that the ESD and I/O driver networks can be optimized without a priori knowledge of peripheral pre-driver circuitry.

AB - The proposed co-design methodology simultaneously optimizes the ESD robustness and functionality of I/O circuitry. The methodology formulates an equivalent optimization problem so that the ESD and I/O driver networks can be optimized without a priori knowledge of peripheral pre-driver circuitry.

UR - http://www.scopus.com/inward/record.url?scp=84938152283&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84938152283&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:84938152283

SN - 0739-5159

VL - 2014-November

JO - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

JF - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

IS - November

T2 - 36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014

Y2 - 7 September 2014 through 12 September 2014

ER -

A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry

Abstract

ASJC Scopus subject areas

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