The proposed co-design methodology simultaneously optimizes the ESD robustness and functionality of I/O circuitry. The methodology formulates an equivalent optimization problem so that the ESD and I/O driver networks can be optimized without a priori knowledge of peripheral pre-driver circuitry.
|Original language||English (US)|
|Journal||Electrical Overstress/Electrostatic Discharge Symposium Proceedings|
|State||Published - Nov 26 2014|
|Event||36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 - Tucson, United States|
Duration: Sep 7 2014 → Sep 12 2014
ASJC Scopus subject areas
- Electrical and Electronic Engineering