A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry

Kuo Hsuan Meng, Alex Gerdemann, James W. Miller, Elyse Rosenbaum

Research output: Contribution to journalConference articlepeer-review


The proposed co-design methodology simultaneously optimizes the ESD robustness and functionality of I/O circuitry. The methodology formulates an equivalent optimization problem so that the ESD and I/O driver networks can be optimized without a priori knowledge of peripheral pre-driver circuitry.

Original languageEnglish (US)
JournalElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Issue numberNovember
StatePublished - Nov 26 2014
Event36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 - Tucson, United States
Duration: Sep 7 2014Sep 12 2014

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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