Abstract
A low-noise 2-21 GHz monolithic distributed amplifier utilizing 0.35-micrometer-gate-length HEMT devices has achieved 12±0.5 dB of gain. This represents the highest gain reported for a distributed amplifier using single FET gain cells. A record low noise figure of 3 dB was achieved midband (4-12 GHz). The circuit design utilizes five HEMT transistors Of varying width with gates fabricated by E-beam lithography. The same amplifier fabricated with 0.35- \i m-gate-length MESFET's in place of the HEMT devices resulted in 9.5 ±0.5 dB of gain across the 2-20 GHz band. This record performance level for a MESFET distributed amplifier is used to determine that the use of HEMT devices rather than the small gate lengths is primarily responsible for the HEMT amplifier performance.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2603-2609 |
| Number of pages | 7 |
| Journal | IEEE Transactions on Electron Devices |
| Volume | 34 |
| Issue number | 12 |
| DOIs | |
| State | Published - Dec 1987 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
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