A 150 MHz voltage controlled oscillator using lithium niobate RF-MEMS resonator

Ali Kourani, Yong Ha Song, Brandon Arakawa, Ruochen Lu, Junfeng Guan, Anming Gao, Songbin Gong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the first radio frequency (RF) voltage controlled MEMS oscillator (VCMO) using a high Q Lithium Niobate (LiNbO3) micromechanical resonator. The resonator has a quality factor of 650 in air with a motional impedance of 262 Ω. The oscillator's measured phase noise is -84.4 dBc/Hz and -146 dBc/Hz at 1 kHz and 1 MHz offsets respectively from a 149.13 MHz carrier with an output power of -8.6 dBm. The oscillator consumes less than 1 mA with a tuning range of 0.42 MHz. Such VCMOs are envisioned to enable low power, and low phase noise RF signal synthesis for Internet of Things applications.

Original languageEnglish (US)
Title of host publication2017 IEEE MTT-S International Microwave Symposium, IMS 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1307-1310
Number of pages4
ISBN (Electronic)9781509063604
DOIs
StatePublished - Oct 4 2017
Event2017 IEEE MTT-S International Microwave Symposium, IMS 2017 - Honololu, United States
Duration: Jun 4 2017Jun 9 2017

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
ISSN (Print)0149-645X

Other

Other2017 IEEE MTT-S International Microwave Symposium, IMS 2017
CountryUnited States
CityHonololu
Period6/4/176/9/17

Keywords

  • Internet of things
  • Lithium niobate
  • Phase noise
  • RF MEMS
  • Tuning range
  • VCO

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Kourani, A., Song, Y. H., Arakawa, B., Lu, R., Guan, J., Gao, A., & Gong, S. (2017). A 150 MHz voltage controlled oscillator using lithium niobate RF-MEMS resonator. In 2017 IEEE MTT-S International Microwave Symposium, IMS 2017 (pp. 1307-1310). [8058851] (IEEE MTT-S International Microwave Symposium Digest). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSYM.2017.8058851