TY - GEN
T1 - A 14.5 fJ/cycle/k-gate, 0.33 V ECG processor in 45nm CMOS using statistical error compensation
AU - Abdallah, Rami A.
AU - Shanbhag, Naresh R.
PY - 2012
Y1 - 2012
N2 - A subthreshold ECG processor in IBM 45 nm SOI CMOS is designed to operate at the minimum energy operating point (MEOP). Statistical error compensation (SEC) is employed to further reduce energy (Emin) at the MEOP. SEC is shown to reduce Emin by 28% compared to the conventional (error-free) case while maintaining acceptable beat-detection performance. SEC enables the supply voltage to be scaled to 15% below its critical value at MEOP, while compensating for a 58% pre-correction error rate pe. These results represent an improvement of 19x in beat-detection performance, and 600x in pe over conventional (error-free) systems. The prototype IC consumes 14.5 fJ/cycle/1k-gate and exhibits 4.7x better energy efficiency than the state-of-the-art while tolerating 16x more voltage variations.
AB - A subthreshold ECG processor in IBM 45 nm SOI CMOS is designed to operate at the minimum energy operating point (MEOP). Statistical error compensation (SEC) is employed to further reduce energy (Emin) at the MEOP. SEC is shown to reduce Emin by 28% compared to the conventional (error-free) case while maintaining acceptable beat-detection performance. SEC enables the supply voltage to be scaled to 15% below its critical value at MEOP, while compensating for a 58% pre-correction error rate pe. These results represent an improvement of 19x in beat-detection performance, and 600x in pe over conventional (error-free) systems. The prototype IC consumes 14.5 fJ/cycle/1k-gate and exhibits 4.7x better energy efficiency than the state-of-the-art while tolerating 16x more voltage variations.
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U2 - 10.1109/CICC.2012.6330670
DO - 10.1109/CICC.2012.6330670
M3 - Conference contribution
AN - SCOPUS:84869453625
SN - 9781467315555
T3 - Proceedings of the Custom Integrated Circuits Conference
BT - Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012
T2 - 34th Annual Custom Integrated Circuits Conference, CICC 2012
Y2 - 9 September 2012 through 12 September 2012
ER -