TY - GEN
T1 - A 1.4μW/MHz 100MHz RC Oscillator with ±1030ppm Inaccuracy from -40°C to 85°C After Accelerated Aging for 500 Hours at 125°C
AU - Park, Kyu Sang
AU - Pal, Nilanjan
AU - Li, Yongxin
AU - Xia, Ruhao
AU - Wang, Tianyu
AU - Abdelrahman, Ahmed
AU - Hanumolu, Pavan Kumar
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Monolithic RC oscillators are increasingly becoming the preferred clock source in many applications, which typically have used bulky crystal or MEMS oscillators. Using novel methods to compensate for the frequency inaccuracy caused by the temperature coefficient (TC) of the resistors used in the reference RC networks, prior works have achieved excellent short-term frequency stability [1], [2]. While this level of performance undoubtedly makes RC oscillators a desirable option even in applications requiring medium-to-high stability clock sources, they cannot be deployed commercially until the performance is guaranteed over their lifetime. Unfortunately, literature on the aging behavior of RC oscillators is scarce. Given this critical shortcoming, this paper quantifies aging in RC oscillators and presents methods to overcome it. The results obtained from prototype oscillators indicate that aging can cause more than 5000ppm long-term frequency drift. The proposed compensation techniques reduce it to less than 500ppm.
AB - Monolithic RC oscillators are increasingly becoming the preferred clock source in many applications, which typically have used bulky crystal or MEMS oscillators. Using novel methods to compensate for the frequency inaccuracy caused by the temperature coefficient (TC) of the resistors used in the reference RC networks, prior works have achieved excellent short-term frequency stability [1], [2]. While this level of performance undoubtedly makes RC oscillators a desirable option even in applications requiring medium-to-high stability clock sources, they cannot be deployed commercially until the performance is guaranteed over their lifetime. Unfortunately, literature on the aging behavior of RC oscillators is scarce. Given this critical shortcoming, this paper quantifies aging in RC oscillators and presents methods to overcome it. The results obtained from prototype oscillators indicate that aging can cause more than 5000ppm long-term frequency drift. The proposed compensation techniques reduce it to less than 500ppm.
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U2 - 10.1109/ISSCC42615.2023.10067729
DO - 10.1109/ISSCC42615.2023.10067729
M3 - Conference contribution
AN - SCOPUS:85151763938
T3 - Digest of Technical Papers - IEEE International Solid-State Circuits Conference
SP - 62
EP - 64
BT - 2023 IEEE International Solid-State Circuits Conference, ISSCC 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2023 IEEE International Solid-State Circuits Conference, ISSCC 2023
Y2 - 19 February 2023 through 23 February 2023
ER -