Abstract
A reference-less highly digital half-rate clock and data recovery (CDR) circuit with improved tolerance to input duty cycle error is presented. Using a chain of frequency dividers, the proposed frequency detector produces a known sub-harmonic tone from the incoming random data. A digital frequency-locked loop uses the extracted tone, and drives the oscillator to any sub-rate of the input data frequency. The early/late outputs of a conventional half-rate bang-bang phase detector are used to determine the duty-cycle error in the incoming random data and adjust the oscillator clock phases to maximize receiver timing margins. Fabricated in 0.13 μm CMOS technology, the prototype digital CDR operates without any errors from 0.5 Gb/s to 2.5 Gb/s. At 2 Gb/s, the prototype consumes 6.1 mW power from a 1.2 V supply. The proposed clock-phase calibration is capable of correcting upto ±20% of input data duty-cycle error.
| Original language | English (US) |
|---|---|
| Article number | 6069580 |
| Pages (from-to) | 3150-3162 |
| Number of pages | 13 |
| Journal | IEEE Journal of Solid-State Circuits |
| Volume | 46 |
| Issue number | 12 |
| DOIs | |
| State | Published - Dec 2011 |
| Externally published | Yes |
Keywords
- Digital CDR
- clock phase calibration
- data duty cycle error
- linear delay cell
- optimal sampling
- power spectral density of random NRZ data
- reference-less frequency acquisition
ASJC Scopus subject areas
- Electrical and Electronic Engineering
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