TY - JOUR
T1 - A 0.5-to-2.5 Gb/s reference-less half-rate digital CDR with unlimited frequency acquisition range and improved input duty-cycle error tolerance
AU - Inti, Rajesh
AU - Yin, Wenjing
AU - Elshazly, Amr
AU - Sasidhar, Naga
AU - Hanumolu, Pavan Kumar
N1 - Funding Information:
Manuscript received April 16, 2011; revised July 01, 2011; accepted August 01, 2011. Date of publication November 03, 2011; date of current version November 23, 2011. This paper was approved by Guest Editor Miki Moyal. This work was supported in part by the National Science Foundation (NSF) under CAREER EECS-0954969 and by a research grant from Intel.
PY - 2011/12
Y1 - 2011/12
N2 - A reference-less highly digital half-rate clock and data recovery (CDR) circuit with improved tolerance to input duty cycle error is presented. Using a chain of frequency dividers, the proposed frequency detector produces a known sub-harmonic tone from the incoming random data. A digital frequency-locked loop uses the extracted tone, and drives the oscillator to any sub-rate of the input data frequency. The early/late outputs of a conventional half-rate bang-bang phase detector are used to determine the duty-cycle error in the incoming random data and adjust the oscillator clock phases to maximize receiver timing margins. Fabricated in 0.13 μm CMOS technology, the prototype digital CDR operates without any errors from 0.5 Gb/s to 2.5 Gb/s. At 2 Gb/s, the prototype consumes 6.1 mW power from a 1.2 V supply. The proposed clock-phase calibration is capable of correcting upto ±20% of input data duty-cycle error.
AB - A reference-less highly digital half-rate clock and data recovery (CDR) circuit with improved tolerance to input duty cycle error is presented. Using a chain of frequency dividers, the proposed frequency detector produces a known sub-harmonic tone from the incoming random data. A digital frequency-locked loop uses the extracted tone, and drives the oscillator to any sub-rate of the input data frequency. The early/late outputs of a conventional half-rate bang-bang phase detector are used to determine the duty-cycle error in the incoming random data and adjust the oscillator clock phases to maximize receiver timing margins. Fabricated in 0.13 μm CMOS technology, the prototype digital CDR operates without any errors from 0.5 Gb/s to 2.5 Gb/s. At 2 Gb/s, the prototype consumes 6.1 mW power from a 1.2 V supply. The proposed clock-phase calibration is capable of correcting upto ±20% of input data duty-cycle error.
KW - Digital CDR
KW - clock phase calibration
KW - data duty cycle error
KW - linear delay cell
KW - optimal sampling
KW - power spectral density of random NRZ data
KW - reference-less frequency acquisition
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U2 - 10.1109/JSSC.2011.2168872
DO - 10.1109/JSSC.2011.2168872
M3 - Article
AN - SCOPUS:82155166222
SN - 0018-9200
VL - 46
SP - 3150
EP - 3162
JO - IEEE Journal of Solid-State Circuits
JF - IEEE Journal of Solid-State Circuits
IS - 12
M1 - 6069580
ER -