850 nm oxide-VCSEL with low relative intensity noise and 40 Gb/s error free data transmission

Fei Tan, Mong Kai Wu, Michael Liu, Milton Feng, Nick Holonyak

Research output: Contribution to journalArticle

Abstract

We have designed and fabricated a high speed 850 nm oxide-confined vertical cavity surface emitting laser with an oxide aperture dimension of ~4 μm and a threshold current ITH = 0.53 mA at room temperature (20 °C). It demonstrates a modulation bandwidth of 21.2 GHz, and achieves a laser relative intensity noise reaching standard quantum limit 2hν/P0 = -154.3 dB/Hz at high bias I/ITH = 10. Furthermore, error-free data transmission at 40 Gb/s is obtained at I = 6.5 mA which corresponds to an energy/data efficiency of 431 fJ/bit.

Original languageEnglish (US)
Article number6589110
Pages (from-to)289-292
Number of pages4
JournalIEEE Photonics Technology Letters
Volume26
Issue number3
DOIs
StatePublished - Feb 1 2014

Keywords

  • 40 Gb/s error free data transmission
  • VCSEL
  • ultralow laser relative intensity noise

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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