40 Gb/s VCSELs test data collection, analysis, and process problem identification

Keyphrases

• Aperture Size 33%
• Collection Analysis 100%
• Collection Method 100%
• Data Analysis Methods 66%
• Device Performance 33%
• Device Processing 33%
• Device Testing 33%
• Heat Map 33%
• Information Feedback 33%
• Key Performance Indicators 33%
• Measurement Procedure 33%
• On-wafer Measurement 33%
• Optical Aperture 33%
• Oxide VCSEL 33%
• Performance Uniformity 33%
• Power Output 66%
• Power Threshold 33%
• Problem Identification 100%
• Quality Assurance 33%
• Testing Data 33%
• Vertical-cavity Surface-emitting Laser (VCSEL) 100%
• Wafer-scale 33%

Engineering

• Device Performance 50%
• Feedback Information 50%
• Metrics 50%
• Output Power 100%
• Review Paper 50%
• Test Data 100%

Material Science

• Oxide Compound 100%