Abstract
Recent solar cell results suggest that a (220) or (204) orientation of CIGS thin films may have unique and possibly superior properties. We have deposited high-quality epitaxial mixed (220) and (204)-oriented CIGS layers on GaAs (110). The surfaces consist of highly tilted terraces of large flat (112) facets alternating with rough (112) planes. Temperature-dependent Hall-effect shows up to a 20 fold decrease in carrier concentration relative to films grown with (112) and (002) orientations. Carrier compensation and other defects observed in the (002) and (112) oriented films was reduced without Na addition In the (220)/(204) films. Changes in the hole mobility were also observed. Theoretical modeling using the AMPS computer code suggests that such a change in carrier concentration could lead to improvements in device performances in sufficiently good devices, consistent with observations.
Original language | English (US) |
---|---|
Title of host publication | Conference Record of the 28th IEEE Photovoltaic Specialists Conference - 2000 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 446-449 |
Number of pages | 4 |
Volume | 2000-January |
ISBN (Electronic) | 0780357728 |
DOIs | |
State | Published - 2000 |
Event | 28th IEEE Photovoltaic Specialists Conference, PVSC 2000 - Anchorage, United States Duration: Sep 15 2000 → Sep 22 2000 |
Other
Other | 28th IEEE Photovoltaic Specialists Conference, PVSC 2000 |
---|---|
Country/Territory | United States |
City | Anchorage |
Period | 9/15/00 → 9/22/00 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Control and Systems Engineering
- Industrial and Manufacturing Engineering