2-D material molybdenum disulfide analyzed by XPS

D. Ganta, S. Sinha, Richard T. Haasch

Research output: Contribution to journalArticle

Abstract

Molybdenum disulfide (MoS2), a two-dimensional material purchased from SPI supplies, was analyzed using high-resolution X-ray photoelectron spectroscopy (XPS). A flake was mechanically exfoliated from a MoS2 bulk single crystal for the study. The XPS spectra of MoS 2 obtained using monochromatic Al Kα radiation at 0.83401 nm include a survey scan, high-resolution spectra of O 1s, Mo 3p, C 1s, Mo 3d, S 2s, S 2p, Mo 4s, Mo 4p, S 3s, and valance band. Extended energy ranges were collected in the vicinity of the Mo 3d/S 2s, S 2p, and Mo 4s/Mo 4p/S 3s/Valence band regions allowing for fitting of surface plasmon features and determination of Tougaard scattering cross-section parameters. Quantitative analysis indicates a surface composition of MoS1.9.

Original languageEnglish (US)
Pages (from-to)19-27
Number of pages9
JournalSurface Science Spectra
Volume21
Issue number1
DOIs
StatePublished - Dec 2014

Keywords

  • 2D material
  • XPS
  • transition metal dichalcogenide
  • x-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Fingerprint Dive into the research topics of '2-D material molybdenum disulfide analyzed by XPS'. Together they form a unique fingerprint.

  • Cite this