Abstract
Molybdenum disulfide (MoS2), a two-dimensional material purchased from SPI supplies, was analyzed using high-resolution X-ray photoelectron spectroscopy (XPS). A flake was mechanically exfoliated from a MoS2 bulk single crystal for the study. The XPS spectra of MoS 2 obtained using monochromatic Al Kα radiation at 0.83401 nm include a survey scan, high-resolution spectra of O 1s, Mo 3p, C 1s, Mo 3d, S 2s, S 2p, Mo 4s, Mo 4p, S 3s, and valance band. Extended energy ranges were collected in the vicinity of the Mo 3d/S 2s, S 2p, and Mo 4s/Mo 4p/S 3s/Valence band regions allowing for fitting of surface plasmon features and determination of Tougaard scattering cross-section parameters. Quantitative analysis indicates a surface composition of MoS1.9.
Original language | English (US) |
---|---|
Pages (from-to) | 19-27 |
Number of pages | 9 |
Journal | Surface Science Spectra |
Volume | 21 |
Issue number | 1 |
DOIs | |
State | Published - Dec 2014 |
Keywords
- 2D material
- XPS
- transition metal dichalcogenide
- x-ray photoelectron spectroscopy
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films