Abstract
A type-II GaAsSb Double Heterojunction Bipolar Transistor (DHBT) with an AlInP emitter, doping-graded GaAsSb base, and InP collector has been grown by molecular beam epitaxy. The 0.38 μm emitter devices have been fabricated by a triple-mesa wet etch process and demonstrated fT / fMAX = 470/540 GHz at JC = 5.1 mA/μm2 and VCB = 0.65 V. This performance is comparable with compositiongraded base devices with similar emitter width.
Original language | English (US) |
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Article number | 6678780 |
Pages (from-to) | 24-26 |
Number of pages | 3 |
Journal | IEEE Electron Device Letters |
Volume | 35 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2014 |
Keywords
- DHBT
- GaAsSb
- InP
- doping graded
- millimeter-wave
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering