Li, Y., Qian, J. C., Jiang, Z. H., Lo, T. H., Ding, D., Draher, T., Polakovic, T.,
Pfaff, W.,
Schleife, A.,
Zuo, J. M., Kwok, W. K., Novosad, V. &
Hoffmann, A.,
2022,
2022 International Electron Devices Meeting, IEDM 2022. Institute of Electrical and Electronics Engineers Inc.,
p. 1461-1464 4 p. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2022-December).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution