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Fingerprint Fingerprint is based on mining the text of the expert's scholarly documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 2 Similar Profiles
Graphite Chemical Compounds
Graphene Engineering & Materials Science
graphene Physics & Astronomy
Gate dielectrics Engineering & Materials Science
Hafnium oxides Engineering & Materials Science
Field effect transistors Engineering & Materials Science
molybdenum disulfides Physics & Astronomy
Ferroelectric materials Engineering & Materials Science

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Research Output 1996 2019

  • 49 Article
  • 11 Conference contribution
  • 6 Conference article
  • 2 Review article

Exploring New Metal Electrodes for Ferroelectric Aluminum-Doped Hafnium Oxide

Ryu, H., Xu, K., Kim, J., Kang, S., Guo, J. & Zhu, W., May 2019, In : IEEE Transactions on Electron Devices. 66, 5, p. 2359-2364 6 p., 8682093.

Research output: Contribution to journalArticle

Open Access
Hafnium oxides
Ferroelectric materials

Nanoscale electronic devices based on transition metal dichalcogenides

Zhu, W., Low, T., Wang, H., Ye, P. & Duan, X., Jun 3 2019, In : 2D Materials. 6, 3, 032004.

Research output: Contribution to journalReview article

Transition metals
transition metals
Data storage equipment
Phase change memory

A general and simple method for evaluating the electrical transport performance of graphene by the van der Pauw–Hall measurement

Qing, F., Shu, Y., Qing, L., Niu, Y., Guo, H., Zhang, S., Liu, C., Shen, C., Zhang, W., Mao, S. S., Zhu, W. & Li, X., Nov 30 2018, In : Science Bulletin. 63, 22, p. 1521-1526 6 p.

Research output: Contribution to journalArticle

carrier mobility
field effect transistors
transport properties

Atomic layer deposition of Al 2 O 3 and TiO 2 on MoS 2 surfaces

Kropp, J. A., Cai, Y., Yao, Z., Zhu, W. & Gougousi, T., Nov 1 2018, In : Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 36, 6, 06A101.

Research output: Contribution to journalArticle

Atomic layer deposition
atomic layer epitaxy
Chemical vapor deposition
vapor deposition
Film growth

Dielectric-induced interface states in black phosphorus and tungsten diselenide capacitors

Liu, J., Zhou, Y. & Zhu, W., Jul 2 2018, In : Applied Physics Letters. 113, 1, 013103.

Research output: Contribution to journalArticle

boron nitrides
minority carriers