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Fingerprint Fingerprint is based on mining the text of the expert's scholarly documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 7 Similar Profiles

Research Output

  • 5 Article
  • 4 Conference contribution
  • 1 Conference article

Generalized micro-specialization for modern DBMS architectures

He, W., May 14 2017, SIGMOD 2017 - Student Research Competition - Proceedings of the 2017 ACM International Conference on Management of Data. Association for Computing Machinery, p. 49-51 3 p. (Proceedings of the ACM SIGMOD International Conference on Management of Data; vol. Part F127846).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • A heterogeneity based method to identify major variability component

    Shaikh, F., He, W., Sprinkle, J., Chen, K. & Roveda, J. M., Jan 1 2015, Electronics, Communications and Networks IV - Proceedings of the 4th International Conference on Electronics, Communications and Networks, CECNet2014. Hussain, A. & Ivanovic, M. (eds.). p. 1611-1615 5 p. (Electronics, Communications and Networks IV - Proceedings of the 4th International Conference on Electronics, Communications and Networks, CECNet2014; vol. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Gate length scaling and high drive currents enabled for high performance SOI technology using high-κ/metal gate

    Henson, K., Bu, H., Na, M. H., Liang, Y., Kwon, U., Krishnan, S., Schaeffer, J., Jha, R., Moumen, N., Carter, R., De Wan, C., Donaton, R., Guo, D., Hargrove, M., He, W., Mo, R., Ramachandran, R., Ramani, K., Schonenberg, K., Tsang, Y. & 18 others, Wang, X., Gribelyuk, M., Yan, W., Shepard, J., Cartier, E., Frank, M., Harley, E., Arndt, R., Knarr, R., Bailey, T., Zhang, B., Wong, K., Graves-Abe, T., Luckowski, E., Park, D. G., Narayanan, V., Chudzik, M. & Khare, M., Dec 1 2008, 2008 IEEE International Electron Devices Meeting, IEDM 2008. 4796774. (Technical Digest - International Electron Devices Meeting, IEDM).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Electron tunneling spectroscopy study of amorphous films of the gate dielectric candidates LaAlO3 and LaScO3

    Wang, M., He, W., Ma, T. P., Edge, L. F. & Schlom, D. G., Feb 19 2007, In : Applied Physics Letters. 90, 5, 053502.

    Research output: Contribution to journalArticle

  • High-performance high-κ/metal gates for 45nm CMOS and beyond with gate-first processing

    Chudzik, M., Doris, B., Mo, R., Sleight, J., Cartier, E., Dewan, C., Park, D., Bu, H., Natzle, W., Yan, W., Ouyang, C., Henson, K., Boyd, D., Callegari, S., Carter, R., Casarotto, D., Gribelyuk, M., Hargrove, M., He, W., Kim, Y. & 17 others, Linder, B., Moumen, N., Paruchuri, V. K., Stathis, J., Steen, M., Vayshenker, A., Wang, X., Zafar, S., Ando, T., Iijima, R., Takayanagi, M., Narayanan, V., Wise, R., Zhang, Y., Divakaruni, R., Khare, M. & Chen, T. C., Dec 1 2007, In : Digest of Technical Papers - Symposium on VLSI Technology. p. 194-195 2 p., 4339689.

    Research output: Contribution to journalConference article