Shobha Vasudevan

20042019
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Hardware Engineering & Materials Science
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Static analysis Engineering & Materials Science
Computer hardware description languages Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
Temporal logic Engineering & Materials Science
Engines Engineering & Materials Science

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Research Output 2004 2019

  • 43 Conference contribution
  • 15 Article
  • 2 Conference article

A figure of merit for assertions in verification

Hertz, S., Pal, D., Offenberger, S. & Vasudevan, S., Jan 21 2019, ASP-DAC 2019 - 24th Asia and South Pacific Design Automation Conference. Institute of Electrical and Electronics Engineers Inc., p. 675-680 6 p. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon

Assertion Ranking using RTL Source Code Analysis

Pal, D., Offenberger, S. & Vasudevan, S., Jan 1 2019, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Research output: Contribution to journalArticle

Directed graphs

Automated Generation and Selection of Interpretable Features for Enterprise Security

Duan, J., Zeng, Z., Oprea, A. & Vasudevan, S., Jan 22 2019, Proceedings - 2018 IEEE International Conference on Big Data, Big Data 2018. Song, Y., Liu, B., Lee, K., Abe, N., Pu, C., Qiao, M., Ahmed, N., Kossmann, D., Saltz, J., Tang, J., He, J., Liu, H. & Hu, X. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 1258-1265 8 p. 8621986. (Proceedings - 2018 IEEE International Conference on Big Data, Big Data 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fourier analysis
Boolean functions
Clustering algorithms
Learning systems
Industry

Guilty As Charged: Computational Reliability Threats Posed by Electrostatic Discharge-induced Soft Errors

Feng, K., Vora, S., Jiang, R., Rosenbaum, E. & Vasudevan, S., May 14 2019, Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019. Institute of Electrical and Electronics Engineers Inc., p. 156-161 6 p. 8715149. (Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Soft Error
Electrostatic discharge
Electrostatics
Chip
Microcontroller

Application level hardware tracing for scaling post-silicon debug

Pal, D., Sharma, A., Ray, S., De Paula, F. M. & Vasudevan, S., Jun 24 2018, Proceedings of the 55th Annual Design Automation Conference, DAC 2018. Institute of Electrical and Electronics Engineers Inc., Vol. Part F137710. a92

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tracing
Silicon
Trace
Hardware
Debugging