1971 …2020
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Fingerprint Fingerprint is based on mining the text of the expert's scholarly documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 5 Similar Profiles
Irradiation Engineering & Materials Science
irradiation Physics & Astronomy
Molecular dynamics Engineering & Materials Science
Ion bombardment Engineering & Materials Science
molecular dynamics Physics & Astronomy
cascades Physics & Astronomy
Atoms Engineering & Materials Science
ion beams Physics & Astronomy

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Research Output 1971 2020

Irradiation induced creep in nanocrystalline high entropy alloys

Jawaharram, G. S., Barr, C. M., Monterrosa, A. M., Hattar, K., Averback, R. S. & Dillon, S. J., Jan 1 2020, In : Acta Materialia. 182, p. 68-76 9 p.

Research output: Contribution to journalArticle

Creep
Entropy
Irradiation
Dosimetry
Grain boundaries

Effects of ternary alloy additions on the microstructure of highly immiscible Cu alloys subjected to severe plastic deformation: An evaluation of the effective temperature model

Verma, N., Pant, N., Beach, J. A., Ivanisenko, J., Ashkenazy, Y., Dillon, S. J., Bellon, P. & Averback, R. S., May 15 2019, In : Acta Materialia. 170, p. 218-230 13 p.

Research output: Contribution to journalArticle

Ternary alloys
Plastic deformation
Microstructure
Binary alloys
Ball milling
Open Access
Long Term Evolution (LTE)
Vacancies
Solid solutions
solid solutions
Fluxes

High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy

Jawaharram, G. S., Price, P. M., Barr, C. M., Hattar, K., Averback, R. S. & Dillon, S. J., Apr 15 2018, In : Scripta Materialia. 148, p. 1-4 4 p.

Research output: Contribution to journalArticle

Creep
Irradiation
Transmission electron microscopy
Laser heating
transmission electron microscopy

Improving atomic displacement and replacement calculations with physically realistic damage models

Nordlund, K., Zinkle, S. J., Sand, A. E., Granberg, F., Averback, R. S., Stoller, R., Suzudo, T., Malerba, L., Banhart, F., Weber, W. J., Willaime, F., Dudarev, S. L. & Simeone, D., Dec 1 2018, In : Nature communications. 9, 1, 1084.

Research output: Contribution to journalArticle

Radiation
damage
Atoms
Semiconductors
Computer Simulation