Fingerprint Fingerprint is based on mining the text of the expert's scholarly documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 21 Similar Profiles
Hardware Engineering & Materials Science
Fault tolerance Engineering & Materials Science
Monitoring Engineering & Materials Science
Experiments Engineering & Materials Science
Detectors Engineering & Materials Science
Availability Engineering & Materials Science
Program processors Engineering & Materials Science
Error detection Engineering & Materials Science

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Research Output 1977 2017

Analysis and diagnosis of SLA violations in a production SaaS cloud

Di Martino, C., Sarkar, S., Ganesan, R., Kalbarczyk, Z. T. & Iyer, R. K. Mar 1 2017 In : IEEE Transactions on Reliability. 66, 1, p. 54-75 22 p., 7835304

Research output: Contribution to journalArticle

Data reduction
Failure modes

Attack induced common-mode failures on PLC-based safety system in a nuclear power plant: Practical experience report

Lim, B., Chen, D., An, Y., Kalbarczyk, Z. & Iyer, R. May 5 2017 Proceedings - 2017 IEEE 22nd Pacific Rim International Symposium on Dependable Computing, PRDC 2017. IEEE Computer Society, p. 205-210 6 p. 7920614

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Programmable logic controllers
Nuclear power plants
Failure modes
Security systems

Attacking supercomputers through targeted alteration of environmental control: A data driven case study

Chung, K., Formicola, V., Kalbarczyk, Z. T., Iyer, R. K., Withers, A. & Slagell, A. J. Feb 21 2017 2016 IEEE Conference on Communications and Network Security, CNS 2016. Institute of Electrical and Electronics Engineers Inc., p. 406-410 5 p. 7860528

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cooling systems
Control systems
Cooling water

Failure Diagnosis for Distributed Systems Using Targeted Fault Injection

Pham, C., Wang, L., Tak, B. C., Baset, S., Tang, C., Kalbarczyk, Z. & Iyer, R. K. Feb 1 2017 In : IEEE Transactions on Parallel and Distributed Systems. 28, 2, p. 503-516 14 p., 7484300

Research output: Contribution to journalArticle

Electric fault location
Information use

Model-based unsupervised learning informs metformininduced cell-migration inhibition through an AMPK-independent mechanism in breast cancer

Athreya, A. P., Kalari, K. R., Cairns, J., Gaglio, A. J., Wills, Q. F., Niu, N., Weinshilboum, R., Iyer, R. K. & Wang, L. 2017 In : Oncotarget. 8, 16, p. 27199-27215 17 p.

Research output: Contribution to journalArticle

Cell Migration Inhibition
AMP-Activated Protein Kinases
Breast Neoplasms