Research Output per year
Fingerprint Fingerprint is based on mining the text of the expert's scholarly documents to create an index of weighted terms, which defines the key subjects of each individual researcher.
- 5 Similar Profiles
x ray scattering
Physics & Astronomy
inelastic scattering
Physics & Astronomy
X rays
Engineering & Materials Science
Scattering
Engineering & Materials Science
Inelastic scattering
Chemical Compounds
cuprates
Physics & Astronomy
x rays
Physics & Astronomy
Raman scattering
Engineering & Materials Science
Network
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Research Output 1994 2018
Anomalous density fluctuations in a strange metal
Mitrano, M., Husain, A. A., Vig, S., Kogar, A., Rak, M. S., Rubeck, S. I., Schmalian, J., Uchoa, B., Schneeloch, J., Zhong, R., Gu, G. D. & Abbamonte, P. M., May 22 2018, In : Proceedings of the National Academy of Sciences of the United States of America. 115, 21, p. 5392-5396 5 p.Research output: Contribution to journal › Article
metals
superconductivity
continuums
momentum
energy
A practical superconducting-microcalorimeter X-ray spectrometer for beamline and laboratory science
Doriese, W. B., Abbamonte, P. M., Alpert, B. K., Bennett, D. A., Denison, E. V., Fang, Y., Fischer, D. A., Fitzgerald, C. P., Fowler, J. W., Gard, J. D., Hays-Wehle, J. P., Hilton, G. C., Jaye, C., McChesney, J. L., Miaja-Avila, L., Morgan, K. M., Joe, Y. I., O'Neil, G. C., Reintsema, C. D., Rodolakis, F. & 6 others, May 1 2017, In : Review of Scientific Instruments. 88, 5, 053108.Research output: Contribution to journal › Article
X ray spectrometers
calorimeters
Spectrometers
spectrometers
Sensors
Importance of σ Bonding Electrons for the Accurate Description of Electron Correlation in Graphene
Zheng, H., Gan, Y., Abbamonte, P. M. & Wagner, L. K., Oct 20 2017, In : Physical review letters. 119, 16, 166402.Research output: Contribution to journal › Article
graphene
metalloids
electrons
pi-electrons
approximation
Influence of Domain Walls in the Incommensurate Charge Density Wave State of Cu Intercalated 1T-TiSe2
Yan, S., Iaia, D., Morosan, E., Fradkin, E. H., Abbamonte, P. M. & Madhavan, V., Mar 10 2017, In : Physical review letters. 118, 10, 106405.Research output: Contribution to journal › Article
domain wall
scanning tunneling microscopy
superconductivity
fermions
scanning
Intrinsic resolving power of XUV diffraction gratings measured with Fizeau interferometry
Gleason, S., Manton, J., Sheung, J., Byrum, T., Jensen, C., Jiang, L., Dvorak, J., Jarrige, I. & Abbamonte, P. M., Jan 1 2017, Advances in Metrology for X-Ray and EUV Optics VII. Asundi, A. K., Ohashi, H. & Assoufid, L. (eds.). SPIE, Vol. 10385. 1038506Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Diffraction Grating
Diffraction gratings
Optical resolving power
Interferometry
gratings (spectra)