Peter Michael Abbamonte

19942018
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Research Output 1994 2018

Anomalous density fluctuations in a strange metal

Mitrano, M., Husain, A. A., Vig, S., Kogar, A., Rak, M. S., Rubeck, S. I., Schmalian, J., Uchoa, B., Schneeloch, J., Zhong, R., Gu, G. D. & Abbamonte, P. M., May 22 2018, In : Proceedings of the National Academy of Sciences of the United States of America. 115, 21, p. 5392-5396 5 p.

Research output: Contribution to journalArticle

metals
superconductivity
continuums
momentum
energy

A practical superconducting-microcalorimeter X-ray spectrometer for beamline and laboratory science

Doriese, W. B., Abbamonte, P. M., Alpert, B. K., Bennett, D. A., Denison, E. V., Fang, Y., Fischer, D. A., Fitzgerald, C. P., Fowler, J. W., Gard, J. D., Hays-Wehle, J. P., Hilton, G. C., Jaye, C., McChesney, J. L., Miaja-Avila, L., Morgan, K. M., Joe, Y. I., O'Neil, G. C., Reintsema, C. D., Rodolakis, F. & 6 othersSchmidt, D. R., Tatsuno, H., Uhlig, J., Vale, L. R., Ullom, J. N. & Swetz, D. S., May 1 2017, In : Review of Scientific Instruments. 88, 5, 053108.

Research output: Contribution to journalArticle

X ray spectrometers
calorimeters
Spectrometers
spectrometers
Sensors

Importance of σ Bonding Electrons for the Accurate Description of Electron Correlation in Graphene

Zheng, H., Gan, Y., Abbamonte, P. M. & Wagner, L. K., Oct 20 2017, In : Physical review letters. 119, 16, 166402.

Research output: Contribution to journalArticle

graphene
metalloids
electrons
pi-electrons
approximation

Influence of Domain Walls in the Incommensurate Charge Density Wave State of Cu Intercalated 1T-TiSe2

Yan, S., Iaia, D., Morosan, E., Fradkin, E. H., Abbamonte, P. M. & Madhavan, V., Mar 10 2017, In : Physical review letters. 118, 10, 106405.

Research output: Contribution to journalArticle

domain wall
scanning tunneling microscopy
superconductivity
fermions
scanning

Intrinsic resolving power of XUV diffraction gratings measured with Fizeau interferometry

Gleason, S., Manton, J., Sheung, J., Byrum, T., Jensen, C., Jiang, L., Dvorak, J., Jarrige, I. & Abbamonte, P. M., Jan 1 2017, Advances in Metrology for X-Ray and EUV Optics VII. Asundi, A. K., Ohashi, H. & Assoufid, L. (eds.). SPIE, Vol. 10385. 1038506

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diffraction Grating
Diffraction gratings
Optical resolving power
Interferometry
gratings (spectra)