M Taher A Saif

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2015
Apparatus and method for in situ testing of microscale and nanoscale samples
Saif, M. T. A. & Kang, W. M., Apr 28 2015, U.S. Patent No. 9019512, Jan 7 2013
Research output: Patent
2013
Apparatus and method for in situ testing of microscale and nanoscale samples
Saif, M. T. A. & Kang, W. M., Jan 8 2013, U.S. Patent No. 8351053, Jun 25 2010
Research output: Patent
2010
Apparatus and method for material testing of microscale and nanoscale samples
Uchic, M. D., Saif, M. T. A. & Han, J. H., Jul 13 2010, U.S. Patent No. 7752916, Aug 31 2007
Research output: Patent
2004
Apparatus and method for testing of microscale to nanoscale thin films
Saif, M. T. A. & Haque, M. A., Nov 16 2004, U.S. Patent No. 6817255, Sep 11 2002
Research output: Patent

Research output