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Research Output 1988 2019

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Conference article
Self assembly
self assembly
wire
Wire
Fabrication
2002

Application of MEMS force sensors for in situ mechanical characterization of nano-scale thin films in SEM and TEM

Haque, M. A. & Saif, M. T. A., Apr 1 2002, In : Sensors and Actuators, A: Physical. 97-98, p. 239-245 7 p.

Research output: Contribution to journalConference article

microelectromechanical systems
MEMS
Transmission electron microscopy
Aluminum
Thin films
1998

Failure of micron scale single crystal silicon bars due to torsion developed by MEMS micro instruments

Saif, M. T. A. & MacDonald, N. C., Dec 1 1998, In : Materials Research Society Symposium - Proceedings. 518, p. 45-49 5 p.

Research output: Contribution to journalConference article

Silicon
Torsional stress
microelectromechanical systems
MEMS
torsion
1996

Reliability studies of single crystal silicon beams for rigid micro mirrors

Saif, M. T. A., Yao, Z. & MacDonald, N. C., Jan 1 1996, In : LEOS Summer Topical Meeting.

Research output: Contribution to journalConference article

Torsional stress
Etching
Mirrors
Single crystals
mirrors
1990

Reliability analysis of dynamic mode I crack growth

Saif, M. T. A., Saif, A. & Ibrahim, Y., Jan 1 1990, In : Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference. pt 2, p. 1174-1182 9 p.

Research output: Contribution to journalConference article

Reliability analysis
Crack propagation
Cracks
Fracture toughness
Random processes
Fatigue crack propagation
Fracture mechanics
Fatigue cracks