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Research Output 2000 2019

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Conference contribution
2019

Efficient numerical modeling of scattering by electrically large objects in a stratified medium for imaging applications

Zhang, K., Goddard, L. L. & Jin, J. M., Sep 2019, Proceedings of the 2019 21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019. Institute of Electrical and Electronics Engineers Inc., 1 p. 8879405. (Proceedings of the 2019 21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Numerical Modeling
scattering
Imaging
Scattering
Green function

High-performance integrated photonics in thin film lithium niobate platform

Bahadori, M., Kar, A., Yang, Y., Lavasani, A., Goddard, L. L. & Gong, S., Jan 1 2019, CLEO: Applications and Technology, CLEO_AT 2019. OSA - The Optical Society, (Optics InfoBase Conference Papers; vol. Part F127-CLEO_AT 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Photonic devices
Photonics
Lithium
Thin films
lithium niobate

High-Performance Integrated Photonics in Thin Film Lithium Niobate Platform

Bahadori, M., Kar, A., Yang, Y., Lavasani, A., Goddard, L. L. & Gong, S., May 2019, 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 8750640. (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Optics and Photonics
Q factor
Photonic devices
lithium niobates
lithium

Regularized phase reconstruction for sensing deep subwavelength perturbations on large-scale wafers

Zhu, J. & Goddard, L. L., Jan 1 2019, CLEO: Applications and Technology, CLEO_AT 2019. OSA - The Optical Society, (Optics InfoBase Conference Papers; vol. Part F127-CLEO_AT 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nanostructures
Inspection
Defects

Regularized Phase Reconstruction for Sensing Deep Subwavelength Perturbations on Large-Scale Wafers

Zhu, J. & Goddard, L. L., May 2019, 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 8749878. (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nanostructures
advanced technology
defect
Inspection
perturbation
2018

Defect inspection using a time-domain mode decomposition technique

Zhu, J. & Goddard, L. L., Jan 1 2018, Metrology, Inspection, and Process Control for Microlithography XXXII. Ukraintsev, V. A. & Adan, O. (eds.). SPIE, 1058508. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 10585).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Defect Inspection
Decomposition Techniques
Time Domain
inspection
Defects

Large-Scale Scattering Analysis of Arbitrary Objects in a Stratified Medium

Zhang, K., Goddard, L. L. & Jin, J., Jan 1 2018, 2018 IEEE Antennas and Propagation Society International Symposium and USNC/URSI National Radio Science Meeting, APSURSI 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 1313-1314 2 p. 8608687. (2018 IEEE Antennas and Propagation Society International Symposium and USNC/URSI National Radio Science Meeting, APSURSI 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Boundary conditions
Scattering
boundary conditions
tearing
scattering
2017

A computational study of a hybrid plasmonic-microring for label-free detection

Braswell, S., Wenner, B., Allen, M., Allen, J., Ephrem, A. & Goddard, L. L., Jan 23 2017, 2016 IEEE Photonics Conference, IPC 2016. Institute of Electrical and Electronics Engineers Inc., 7831148. (2016 IEEE Photonics Conference, IPC 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Labels
Resonators
Molecules
Sensors
resonators

Characterization of lithium niobate microdisk resonators with grating couplers

Kar, A., Gao, A., Goddard, L. L. & Gong, S., Nov 20 2017, 30th Annual Conference of the IEEE Photonics Society, IPC 2017. Institute of Electrical and Electronics Engineers Inc., p. 221-222 2 p. (30th Annual Conference of the IEEE Photonics Society, IPC 2017; vol. 2017-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

lithium niobates
couplers
Q factors
Resonators
Lithium

Enhanced parallel bridge defect inspection using a metalens assisted off-focus scanning imaging

Zhu, J., Purandare, S. & Goddard, L. L., Oct 25 2017, 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 1-2 2 p. (2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings; vol. 2017-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

inspection
Signal to noise ratio
near fields
Microscopes
signal to noise ratios

Focusing properties of a cascaded asymmetric microstructure under Gaussian beam illumination

Zhu, J. & Goddard, L. L., Oct 25 2017, 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 1-2 2 p. (2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings; vol. 2017-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gaussian beams
Lighting
illumination
microstructure
Microstructure

Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules

Bazzoli, M., Silverman, T. J. & Goddard, L. L., Nov 20 2017, 30th Annual Conference of the IEEE Photonics Society, IPC 2017. Institute of Electrical and Electronics Engineers Inc., p. 481-482 2 p. (30th Annual Conference of the IEEE Photonics Society, IPC 2017; vol. 2017-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electroluminescence
electroluminescence
modules
Imaging techniques
Defects

Monolithic integration of vertical SiNx microrings on a ridge waveguide to achieve multi-channel photonic coupling

Yu, X., Goddard, L. L., Li, X. & Chen, X., Jan 1 2017, CLEO: Science and Innovations, CLEO_SI 2017. OSA - The Optical Society, (Optics InfoBase Conference Papers; vol. Part F41-CLEO_SI 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ridge waveguides
Photonics

Monolithic integration of vertical SiNx microrings on a ridge waveguide to achieve multi-channel photonic coupling

Yu, X., Goddard, L. L., Li, X. & Chen, X., Oct 25 2017, 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 1-2 2 p. (2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings; vol. 2017-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ridge waveguides
Photonics
ridges
photonics
waveguides
2016

Axial confinement in the monolithic integrated self-rolled-up vertical SiNx microring resonator on a ridge waveguide

Yu, X., Goddard, L. L., Li, X. & Chen, X., Dec 16 2016, 2016 Conference on Lasers and Electro-Optics, CLEO 2016. Institute of Electrical and Electronics Engineers Inc., 7788687. (2016 Conference on Lasers and Electro-Optics, CLEO 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ridge waveguides
Silicon nitride
silicon nitrides
couplers
ridges

Electromagnetic field modeling for defect detection in 7 nm node patterned wafers

Zhu, J., Zhang, K., Davoudzadeh, N., Wang, X. & Goddard, L. L., Jan 1 2016, Metrology, Inspection, and Process Control for Microlithography XXX. Sanchez, M. I. & Ukraintsev, V. A. (eds.). SPIE, 97780P. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9778).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Defect Detection
Wafer
Electromagnetic fields
Electromagnetic Fields
electromagnetic fields

Far-field light scattering from sub-wavelength wafer patterns using a parallel FETI-DP algorithm

Zhang, K., Zhu, J., Goddard, L. L. & Jin, J., Oct 25 2016, 2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 2009-2010 2 p. 7696711. (2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Light scattering
far fields
light scattering
wafers
Domain decomposition methods

Generalized measurement configuration optimization for accurate reconstruction of periodic nanostructures using optical scatterometry

Zhu, J., Shi, Y., Liu, S. & Goddard, L. L., Jan 1 2016, Metrology, Inspection, and Process Control for Microlithography XXX. Sanchez, M. I. & Ukraintsev, V. A. (eds.). SPIE, 977823. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9778).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scatterometry
Nanostructures
Configuration
optimization
Optimization

Optical clock pulse generation using thermal nonlinearity in microring resonators

Davoudzadeh, N., Arbabi, A., Zhu, J. & Goddard, L. L., Dec 16 2016, 2016 Conference on Lasers and Electro-Optics, CLEO 2016. Institute of Electrical and Electronics Engineers Inc., 7788305. (2016 Conference on Lasers and Electro-Optics, CLEO 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

nonlinear feedback
Nonlinear feedback
Ring lasers
ring lasers
Fiber lasers

Parallel FETI-DP algorithm for defect detection in large-area nanopatterned wafers

Zhang, K., Goddard, L. L. & Jin, J., May 4 2016, 2016 IEEE/ACES International Conference on Wireless Information Technology, ICWITS 2016 and System and Applied Computational Electromagnetics, ACES 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 7465398. (2016 IEEE/ACES International Conference on Wireless Information Technology, ICWITS 2016 and System and Applied Computational Electromagnetics, ACES 2016 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

FETI-DP
Defect Detection
Wafer
communication
wafers
2015

9nm node wafer defect inspection using three-dimensional scanning, a 405nm diode laser, and a broadband source

Zhou, R., Edwards, C., Bryniarski, C. A., Popescu, G. & Goddard, L. L., Jan 1 2015, Metrology, Inspection, and Process Control for Microlithography XXIX. Sanchez, M. I. & Cain, J. P. (eds.). SPIE, 942416. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9424).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Defect Inspection
Diode Laser
Wafer
Broadband
Semiconductor lasers

Demonstration of the first monolithically integrated selfrolled-up tube based vertical photonic coupler

Yu, X., Arbabi, E., Goddard, L. L., Li, X. & Chen, X., May 4 2015, CLEO: Science and Innovations, CLEO-SI 2015. Optical Society of America (OSA), 1 p. (CLEO: Science and Innovations, CLEO-SI 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ridge waveguides
Planar waveguides
Photonics
couplers
ridges

Demonstration of the first monolithically integrated self-rolled-up tube based vertical photonic coupler

Yu, X., Arbabi, E., Goddard, L. L., Li, X. & Chen, X., Aug 10 2015, 2015 Conference on Lasers and Electro-Optics, CLEO 2015. Institute of Electrical and Electronics Engineers Inc., 7183720. (Conference on Lasers and Electro-Optics Europe - Technical Digest; vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ridge waveguides
Planar waveguides
Photonics
couplers
ridges

Fabrication of gray-scale semiconductor structures with dynamic digital projection photochemical etching

Wang, K., Edwards, C., Srivastava, S. N. & Goddard, L. L., May 4 2015, CLEO: Science and Innovations, CLEO-SI 2015. Optical Society of America (OSA), 1 p. (CLEO: Science and Innovations, CLEO-SI 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

gray scale
pyramids
Etching
projection
etching

Fabrication of gray-scale semiconductor structures with dynamic digital projection photochemical etching

Wang, K., Edwards, C., Srivastava, S. N. & Goddard, L. L., Aug 10 2015, 2015 Conference on Lasers and Electro-Optics, CLEO 2015. Institute of Electrical and Electronics Engineers Inc., 7184024. (Conference on Lasers and Electro-Optics Europe - Technical Digest; vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

gray scale
pyramids
Etching
projection
etching

Halo-free quantitative phase imaging with partially coherent light

Nguyen, T. H., Majeed, H., Edwards, C. A., Do, M. N., Goddard, L. L. & Popescu, G., Jan 1 2015, Quantitative Phase Imaging. Park, Y. & Popescu, G. (eds.). SPIE, 93360N. (Progress in Biomedical Optics and Imaging - Proceedings of SPIE; vol. 9336).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Epidemiologic Effect Modifiers
coherent light
Lighting
halos
Imaging techniques

In-situ measurements of nanoscale phenomena using diffraction phase microscopy

Edwards, C., McKeown, S. J., Hwang, S. W., Froeter, P. J., Li, X., Rogers, J. A., Popescu, G. & Goddard, L. L., Jan 1 2015, Quantitative Phase Imaging. Park, Y. & Popescu, G. (eds.). SPIE, 93361K. (Progress in Biomedical Optics and Imaging - Proceedings of SPIE; vol. 9336).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Semiconductors
Palladium
in situ measurement
Noise
Microscopy

Microfluidic device fabrication utilizing virtual masks and photochemical etching

Edwards, L. D., Wang, K., Edwards, C., Yu, X., Srivastava, S. N., Liu, G. L. & Goddard, L. L., Jan 1 2015, Proceedings of Frontiers in Optics 2015, FIO 2015. OSA - The Optical Society, (Proceedings of Frontiers in Optics 2015, FIO 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

microfluidic devices
Microfluidics
Masks
Etching
masks

Monolithically integrated self-rolled-up tube based vertical coupler with planar waveguide - a new 3D photonic integration scheme

Yu, X., Arbabi, E., Goddard, L. L., Li, X. & Chen, X., Jan 1 2015, Integrated Photonics Research, Silicon and Nanophotonics, IPRSN 2015. Optical Society of America (OSA), p. 371p IT2A.5. (Integrated Photonics Research, Silicon and Nanophotonics, IPRSN 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

couplers
ridges
photonics
tubes
waveguides

Monolithic integration of the self-rolled-up vertical SiNx ring resonator and the ridge waveguide

Yu, X., Arbabi, E., Goddard, L. L., Li, X. & Chen, X., Nov 9 2015, 2015 IEEE Photonics Conference, IPC 2015. Institute of Electrical and Electronics Engineers Inc., p. 486-487 2 p. 7323688. (2015 IEEE Photonics Conference, IPC 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ridge waveguides
Resonators

Phase correction in low coherence diffraction phase microscopy using the optical transfer function

Edwards, C., Popescu, G. & Goddard, L. L., Jan 1 2015, Quantitative Phase Imaging. Park, Y. & Popescu, G. (eds.). SPIE, 933610. (Progress in Biomedical Optics and Imaging - Proceedings of SPIE; vol. 9336).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

optical transfer function
Optical transfer function
Lighting
transfer functions
Transfer functions

Quantitative phase imaging with programmable illumination

Kim, T., Edwards, C., Goddard, L. L. & Popescu, G., Jan 1 2015, Quantitative Phase Imaging. Park, Y. & Popescu, G. (eds.). SPIE, 93361F. (Progress in Biomedical Optics and Imaging - Proceedings of SPIE; vol. 9336).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lighting
Microscopic examination
illumination
Light sources
microscopy

Quantitative phase-shifting DIC using programmable spatial light modulators

Nguyen, T. H., Edwards, C., Goddard, L. L. & Popescu, G., Jan 1 2015, Quantitative Phase Imaging. Park, Y. & Popescu, G. (eds.). SPIE, 93360P. (Progress in Biomedical Optics and Imaging - Proceedings of SPIE; vol. 9336).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Polystyrenes
light modulators
Lighting
beads
halos

Semiconductor defect metrology using laser-based quantitative phase imaging

Zhou, R., Edwards, C., Popescu, G. & Goddard, L. L., Jan 1 2015, Quantitative Phase Imaging. Park, Y. & Popescu, G. (eds.). SPIE, 93361I. (Progress in Biomedical Optics and Imaging - Proceedings of SPIE; vol. 9336).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Semiconductors
Crystal defects
Silicon
Silicon wafers
metrology

White-light interferometric microscopy for wafer defect inspection

Zhou, R., Edwards, C., Bryniarski, C., Dallmann, M. F., Popescu, G. & Goddard, L. L., Jan 1 2015, Quantitative Phase Imaging. Park, Y. & Popescu, G. (eds.). SPIE, 93362P. (Progress in Biomedical Optics and Imaging - Proceedings of SPIE; vol. 9336).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Optical microscopy
inspection
Microscopy
Inspection
wafers
2014

9nm node wafer defect inspection using visible light

Zhou, R., Edwards, C., Popescu, G. & Goddard, L. L., Jan 1 2014, Metrology, Inspection, and Process Control for Microlithography XXVIII. SPIE, 905017. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9050).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Defect Inspection
Wafer
inspection
Defects
Inspection

Characterizing microdroplet evaporation using diffraction phase microscopy

Edwards, C., Arbabi, A., Bhaduri, B., Ganti, R., Yunker, P. J., Yodh, A. G., Popescu, G. & Goddard, L. L., Dec 22 2014, 2014 IEEE Photonics Conference, IPC 2014. Institute of Electrical and Electronics Engineers Inc., p. 178-179 2 p. 6995306. (2014 IEEE Photonics Conference, IPC 2014).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Topography
Microscopic examination
topography
Evaporation
Diffraction

Fabrication of diffractive optical elements with digital projection photochemical etching

Edwards, C., Wang, K., Griffin, B. G., Zhou, R., Bhaduri, B., Popescu, G. & Goddard, L. L., Jan 1 2014, CLEO: Science and Innovations, CLEO_SI 2014. Optical Society of American (OSA), (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

digital techniques
Diffractive optical elements
gray scale
Diffraction gratings
Etching

Image formation and halo removal in diffraction phase microscopy with partially coherent illumination

Edwards, C., Nguyen, T. H., Popescu, G. & Goddard, L. L., Oct 14 2014, Frontiers in Optics, FiO 2014. Optical Society of America (OSA)

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Imaging systems
Topography
halos
Microscopic examination
Image processing

Inverse scattering solutions using holographic data

Zhou, R., Kim, T., Goddard, L. L. & Popescu, G., Jan 1 2014, Imaging and Applied Optics - Digital Holography and Three-Dimensional Imaging, DH 2014. Optical Society of American (OSA), (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

inverse scattering
Lighting
illumination
Scattering
Imaging techniques

Reflection-based diffraction phase microscopy using broadband illumination

Edwards, C., Bhaduri, B., Popescu, G. & Goddard, L. L., Oct 14 2014, Frontiers in Optics, FiO 2014. Optical Society of America (OSA), (Frontiers in Optics, FiO 2014).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

imaging techniques
halos
Microscopic examination
Diffraction
Lighting

The unperturbed structure in the coupled mode theory of waveguide gratings

Kamali, S. M., Arbabi, E. & Goddard, L. L., Dec 22 2014, 2014 IEEE Photonics Conference, IPC 2014. Institute of Electrical and Electronics Engineers Inc., p. 611-612 2 p. 6995288. (2014 IEEE Photonics Conference, IPC 2014).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

coupled modes
Waveguides
gratings
waveguides
Distributed Bragg reflectors

Wide-field diffraction phase microscope for precision metrology

Rajshekhar, G., Bhaduri, B., Edwards, C., Zhou, R., Goddard, L. L. & Popescu, G., Jan 1 2014, Imaging and Applied Optics - Digital Holography and Three-Dimensional Imaging, DH 2014. Optical Society of American (OSA)

Research output: Chapter in Book/Report/Conference proceedingConference contribution

metrology
shot
field of view
Microscopes
Diffraction
2013

22 nm node wafer inspection using diffraction phase microscopy and image post-processing

Zhou, R., Popescu, G. & Goddard, L. L., Jun 10 2013, Metrology, Inspection, and Process Control for Microlithography XXVII. 86810G. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8681).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Post-processing
Microscopy
Wafer
Inspection
Diffraction

An active-passive monolithic integration platform with low loss passive section

Arbabi, A., Griffin, B. G. & Goddard, L. L., Dec 1 2013, 2013 IEEE Photonics Conference, IPC 2013. p. 111-112 2 p. 6656396. (2013 IEEE Photonics Conference, IPC 2013).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Semiconductor quantum wells
reflectors
platforms
quantum wells
Lasers

Finding defects in a 22 nm node wafer with visible light

Zhou, R., Popescu, G. & Goddard, L. L., Jan 1 2013, 2013 Conference on Lasers and Electro-Optics, CLEO 2013. IEEE Computer Society, 6832945

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diffraction
Defects
Microscopic examination

Finding defects in a 22 nm node wafer with visible light

Zhou, R., Popescu, G. & Goddard, L. L., Nov 18 2013, CLEO: Science and Innovations, CLEO_SI 2013. (CLEO: Science and Innovations, CLEO_SI 2013).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diffraction
wafers
Defects
defects
diffraction

Functionalized distributed feedback lasers for hydrogen sensing applications

Griffin, B. G., Arbabi, A. & Goddard, L. L., Dec 1 2013, 2013 IEEE Photonics Conference, IPC 2013. p. 610-611 2 p. 6656442. (2013 IEEE Photonics Conference, IPC 2013).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Distributed feedback lasers
distributed feedback lasers
Palladium
palladium
Hydrogen

Grating assisted mode coupling in microring resonators

Arbabi, A. & Goddard, L. L., Dec 1 2013, 2013 IEEE Photonics Conference, IPC 2013. p. 434-435 2 p. 6656623. (2013 IEEE Photonics Conference, IPC 2013).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Photonic devices
coupled modes
Q factors
Resonators
resonators

Observing hydrogen induced deformations in palladium thin-films

Edwards, C., McKeown, S. J., Zhou, J., Popescu, G. & Goddard, L. L., Dec 1 2013, 2013 IEEE Photonics Conference, IPC 2013. p. 612-613 2 p. 6656443. (2013 IEEE Photonics Conference, IPC 2013).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Palladium
palladium
Thin films
Hydrogen
hydrogen