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Research Output 1980 2019

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Conference article

Alternative approach for modeling the hot carrier degradation of the Si/SiO2 interface

Chen, Z., Lee, J. & Lyding, J. W., Jan 1 1998, In : Materials Research Society Symposium - Proceedings. 513, p. 313-317 5 p.

Research output: Contribution to journalConference article

Hot carriers
degradation
Degradation
traps
approximation

Approach for efficiently locating and electrically contacting nanostructures fabricated via UHV-STM lithography on Si(100)

Hersam, M. C., Abeln, G. C. & Lyding, J. W., Jun 1999, In : Microelectronic Engineering. 47, 1, p. 235-237 3 p.

Research output: Contribution to journalConference article

nanofabrication
p-n junctions
Lithography
Nanostructures
lithography

COFACIALLY LINKED METALLOMACROCYCLIC CONDUCTIVE POLYMERS. HALOGEN DOPANT LEVEL AND MACROMOLECULE ARCHITECTURE, ELECTRONIC STRUCTURE, AND CHARGE TRANSPORT.

Diel, B. N., Inabe, T., Lyding, J. W., Schoch, K. F., Kannewurf, C. R. & Marks, T. J., Mar 1 1982, In : American Chemical Society, Polymer Preprints, Division of Polymer Chemistry. 23, 1, p. 124-125 2 p.

Research output: Contribution to journalConference article

Halogens
Macromolecules
Electronic structure
Charge transfer
Polymers

Comparison of n- and p-type InGaAs/InP quantum well infrared photodetectors

Sengupta, D. K., Malin, J. L., Jackson, S. I., Fang, W., Wu, W., Kuo, H. C., Rowe, C., Chuang, S. L., Hsieh, K. C., Tucker, J. R., Lyding, J. W., Feng, M., Stillman, G. E. & Liu, H. C., Dec 1 1996, In : Materials Research Society Symposium - Proceedings. 421, p. 203-208 6 p.

Research output: Contribution to journalConference article

Quantum well infrared photodetectors
quantum well infrared photodetectors
Molecular beams
molecular beams
Gases
scanning tunneling microscopy
Doping (additives)
Scanning tunneling microscopy
arsenic
ultrahigh vacuum

Deuterium process of CMOS devices: New phenomena and dramatic improvement

Chen, Z., Lee, J., Lyding, J. W. & Hess, K., Jan 1 1998, In : Digest of Technical Papers - Symposium on VLSI Technology. p. 180-181 2 p.

Research output: Contribution to journalConference article

Deuterium
Degradation
Electric potential
Temperature

Effects of gallium arsenide passivation on scanning tunneling microscope excited luminescence

Reuter, E. E., Gu, S. Q., Bohn, P. W., Dorsten, J. F., Abeln, G. C., Lyding, J. W. & Bishop, S. G., Dec 1 1995, In : Materials Research Society Symposium - Proceedings. 380, p. 119-124 6 p.

Research output: Contribution to journalConference article

Gallium arsenide
Passivation
passivity
gallium
Luminescence

ENFORCED SEGREGATED STACKING IN METALLOMACROCYCLIC 'METALS. ' NEW INFORMATION ON PHTHALOCYANINE DONOR-ACCEPTOR INTERACTIONS.

Inabe, T., Kannewurf, C. R., Lyding, J. W., Moguel, M. K. & Marks, T. J., Jan 1 1982, In : Molecular crystals and liquid crystals. 93, 1-4, p. 355-367 13 p.

Research output: Contribution to journalConference article

Metals
Doping (additives)
brackets
Optical conductivity
conductivity
MOS devices
Silicon oxides
Ultrahigh vacuum
Deuterium
silicon oxides

High-performance chip reliability from short-time-tests Statistical models for optical interconnect and HCl/TDDB/NBTI deep-submicron transistor failures

Haggag, A., McMahon, W., Hess, K., Cheng, K., Lee, J. & Lyding, J., Jan 1 2001, In : Annual Proceedings - Reliability Physics (Symposium). p. 271-279 9 p.

Research output: Contribution to journalConference article

Optical interconnects
Transistors
Degradation
Defects
Bragg gratings
Oxide films
Deuterium
Hydrogen
Oxides
Annealing

Hydrogen-related extrinsic oxide trap generation in thin gate oxide film during negative-bias temperature instability stress

Lee, J. S., Lyding, J. W. & Hess, K., Jan 1 2004, In : IEEE International Reliability Physics Symposium Proceedings. 2004-January, January, p. 685-686 2 p., 1315451.

Research output: Contribution to journalConference article

Oxide films
Deuterium
Hydrogen
Oxides
Annealing

Implications of atomic-level manipulation on the Si(100) surface: From enhanced CMOS reliability to molecular nanoelectronics

Hersam, M. C., Lee, J., Guisinger, N. P. & Lyding, J. W., May 2000, In : Superlattices and Microstructures. 27, 5, p. 583-591 9 p.

Research output: Contribution to journalConference article

Nanoelectronics
manipulators
Desorption
CMOS
Metals

Interface characterization in an InP/InGaAs resonant tunneling diode by scanning tunneling microscopy

Skala, S. L., Wu, W., Tucker, J. R., Lyding, J. W., Seabaugh, A., Beam, E. A. & Jovanovic, D., Mar 1 1995, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 13, 2, p. 660-663 4 p.

Research output: Contribution to journalConference article

Resonant tunneling diodes
resonant tunneling diodes
Scanning tunneling microscopy
scanning tunneling microscopy
Surface roughness
Microscopes
microscopes
Scanning
Imaging techniques
Molecules

Manufacturing multi-level metal CMOS with deuterium for improved hot carrier reliability

Kizilyalli, I. C., Abeln, G., Chen, Z., Weber, G., Register, F., Harris, E., Chetlur, S., Higashi, G., Schofieled, M., Sen, S., Kotzias, B., Roy, P. K., Lyding, J. & Hess, K., Dec 1 1998, In : Proceedings of SPIE - The International Society for Optical Engineering. 3506, p. 141-146 6 p.

Research output: Contribution to journalConference article

Hot carriers
Deuterium
deuterium
CMOS
manufacturing

Scanning tunneling microscope-based nanolithography for electronic device fabrication

Lyding, J. W., Brockenbrough, R. T., Fay, P. J., Tucker, J. R., Hess, K. & Higman, T. K., Oct 3 1993, In : Proceedings of SPIE - The International Society for Optical Engineering. 10310, p. 111-126 16 p., 1031008.

Research output: Contribution to journalConference article

Nanolithography
Microscope
Scanning
Fabrication
Microscopes

Scanning tunneling microscopy observation of single dangling bonds on the Si(100)2×1:H surface

Liu, L., Yu, J. & Lyding, J. W., Jan 1 2002, In : Materials Research Society Symposium - Proceedings. 705, p. 187-192 6 p.

Research output: Contribution to journalConference article

Dangling bonds
Scanning tunneling microscopy
scanning tunneling microscopy
ultrahigh vacuum
lithography

Silicon-based molecular nanotechnology

Hersam, M. C., Guisinger, N. P. & Lyding, J. W., Jun 1 2000, In : Nanotechnology. 11, 2, p. 70-76 7 p.

Research output: Contribution to journalConference article

Silicon
nanotechnology
Nanotechnology
Molecules
silicon

Simulation of Si-SiO2 defect generation in CMOS chips: From atomistic structure to chip failure rates

Hess, K., Haggag, A., McMahon, W., Fischer, B., Cheng, K., Lee, J. & Lyding, J. W., Dec 1 2000, In : Technical Digest - International Electron Devices Meeting. p. 93-95 3 p.

Research output: Contribution to journalConference article

CMOS
chips
Degradation
Defects
time dependence

Theory of channel hot-carrier degradation in MOSFETs

Hess, K., Register, L. F., McMahon, W., Tuttle, B., Aktas, O., Ravaioli, U., Lyding, J. W. & Kizilyalli, I. C., Dec 1 1999, In : Physica B: Condensed Matter. 272, 1-4, p. 527-531 5 p.

Research output: Contribution to journalConference article

Hot carriers
MOSFET devices
metal oxide semiconductors
field effect transistors
degradation

Ultrahigh vacuum-scanning tunneling microscopy nanofabrication and hydrogen/deuterium desorption from silicon surfaces: Implications for complementary metal oxide semiconductor technology

Lyding, J. W., Hess, K., Abeln, G. C., Thompson, D. S., Moore, J. S., Hersam, M. C., Foley, E. T., Lee, J., Chen, Z., Hwang, S. T., Choi, H., Avouris, P. & Kizilyalli, I. C., Jan 1 1998, In : Applied Surface Science. 130-132, p. 221-230 10 p.

Research output: Contribution to journalConference article

Deuterium
Ultrahigh vacuum
Scanning tunneling microscopy
Silicon
Nanotechnology