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Research Output

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2007

UHV-STM nanofabrication on silicon

Albrecht, P. M., Ruppalt, L. B. & Lyding, J. W., Dec 1 2007, Scanning Probe Microscopy. Springer New York, Vol. 2. p. 880-905 26 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

2001

High-performance chip reliability from short-time-tests-statistical models for optical interconnect and HCI/TDDB/NBTI deep-submicron transistor failures

Haggag, A., McMahon, W., Hess, K., Cheng, K., Lee, J. & Lyding, J., 2001, IEEE International Reliability Physics Symposium Proceedings. Vol. 2001-January. p. 271-279 9 p. 922913

Research output: Chapter in Book/Report/Conference proceedingChapter