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Research Output 1980 2019

Chapter

UHV-STM nanofabrication on silicon

Albrecht, P. M., Ruppalt, L. B. & Lyding, J. W., Dec 1 2007, Scanning Probe Microscopy. Springer New York, Vol. 2. p. 880-905 26 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Ultrahigh vacuum
Silicon
Nanotechnology
Microscopes
Scanning
Comment/debate

Chalcogenide-based 2D materials: Intrinsic nanoscale patterning

Lyding, J. W., Jul 1 2017, In : Nature Materials. 16, 7, p. 706-707 2 p.

Research output: Contribution to journalComment/debate

Electron devices
MOSFET devices
Deuterium
Passivation
Analytical models
Conference article

Alternative approach for modeling the hot carrier degradation of the Si/SiO2 interface

Chen, Z., Lee, J. & Lyding, J. W., Jan 1 1998, In : Materials Research Society Symposium - Proceedings. 513, p. 313-317 5 p.

Research output: Contribution to journalConference article

Hot carriers
degradation
Degradation
traps
approximation

Approach for efficiently locating and electrically contacting nanostructures fabricated via UHV-STM lithography on Si(100)

Hersam, M. C., Abeln, G. C. & Lyding, J. W., Jun 1999, In : Microelectronic Engineering. 47, 1, p. 235-237 3 p.

Research output: Contribution to journalConference article

nanofabrication
p-n junctions
Lithography
Nanostructures
lithography

COFACIALLY LINKED METALLOMACROCYCLIC CONDUCTIVE POLYMERS. HALOGEN DOPANT LEVEL AND MACROMOLECULE ARCHITECTURE, ELECTRONIC STRUCTURE, AND CHARGE TRANSPORT.

Diel, B. N., Inabe, T., Lyding, J. W., Schoch, K. F., Kannewurf, C. R. & Marks, T. J., Mar 1 1982, In : American Chemical Society, Polymer Preprints, Division of Polymer Chemistry. 23, 1, p. 124-125 2 p.

Research output: Contribution to journalConference article

Halogens
Macromolecules
Electronic structure
Charge transfer
Polymers

Comparison of n- and p-type InGaAs/InP quantum well infrared photodetectors

Sengupta, D. K., Malin, J. L., Jackson, S. I., Fang, W., Wu, W., Kuo, H. C., Rowe, C., Chuang, S. L., Hsieh, K. C., Tucker, J. R., Lyding, J. W., Feng, M., Stillman, G. E. & Liu, H. C., Dec 1 1996, In : Materials Research Society Symposium - Proceedings. 421, p. 203-208 6 p.

Research output: Contribution to journalConference article

Quantum well infrared photodetectors
quantum well infrared photodetectors
Molecular beams
molecular beams
Gases
scanning tunneling microscopy
Doping (additives)
Scanning tunneling microscopy
arsenic
ultrahigh vacuum

Deuterium process of CMOS devices: New phenomena and dramatic improvement

Chen, Z., Lee, J., Lyding, J. W. & Hess, K., Jan 1 1998, In : Digest of Technical Papers - Symposium on VLSI Technology. p. 180-181 2 p.

Research output: Contribution to journalConference article

Deuterium
Degradation
Electric potential
Temperature

Effects of gallium arsenide passivation on scanning tunneling microscope excited luminescence

Reuter, E. E., Gu, S. Q., Bohn, P. W., Dorsten, J. F., Abeln, G. C., Lyding, J. W. & Bishop, S. G., Dec 1 1995, In : Materials Research Society Symposium - Proceedings. 380, p. 119-124 6 p.

Research output: Contribution to journalConference article

Gallium arsenide
Passivation
passivity
gallium
Luminescence

ENFORCED SEGREGATED STACKING IN METALLOMACROCYCLIC 'METALS. ' NEW INFORMATION ON PHTHALOCYANINE DONOR-ACCEPTOR INTERACTIONS.

Inabe, T., Kannewurf, C. R., Lyding, J. W., Moguel, M. K. & Marks, T. J., Jan 1 1982, In : Molecular crystals and liquid crystals. 93, 1-4, p. 355-367 13 p.

Research output: Contribution to journalConference article

Metals
Doping (additives)
brackets
Optical conductivity
conductivity
MOS devices
Silicon oxides
Ultrahigh vacuum
Deuterium
silicon oxides

High-performance chip reliability from short-time-tests Statistical models for optical interconnect and HCl/TDDB/NBTI deep-submicron transistor failures

Haggag, A., McMahon, W., Hess, K., Cheng, K., Lee, J. & Lyding, J., Jan 1 2001, In : Annual Proceedings - Reliability Physics (Symposium). p. 271-279 9 p.

Research output: Contribution to journalConference article

Optical interconnects
Transistors
Degradation
Defects
Bragg gratings
Oxide films
Deuterium
Hydrogen
Oxides
Annealing

Hydrogen-related extrinsic oxide trap generation in thin gate oxide film during negative-bias temperature instability stress

Lee, J. S., Lyding, J. W. & Hess, K., Jan 1 2004, In : IEEE International Reliability Physics Symposium Proceedings. 2004-January, January, p. 685-686 2 p., 1315451.

Research output: Contribution to journalConference article

Oxide films
Deuterium
Hydrogen
Oxides
Annealing

Implications of atomic-level manipulation on the Si(100) surface: From enhanced CMOS reliability to molecular nanoelectronics

Hersam, M. C., Lee, J., Guisinger, N. P. & Lyding, J. W., May 2000, In : Superlattices and Microstructures. 27, 5, p. 583-591 9 p.

Research output: Contribution to journalConference article

Nanoelectronics
manipulators
Desorption
CMOS
Metals

Interface characterization in an InP/InGaAs resonant tunneling diode by scanning tunneling microscopy

Skala, S. L., Wu, W., Tucker, J. R., Lyding, J. W., Seabaugh, A., Beam, E. A. & Jovanovic, D., Mar 1 1995, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 13, 2, p. 660-663 4 p.

Research output: Contribution to journalConference article

Resonant tunneling diodes
resonant tunneling diodes
Scanning tunneling microscopy
scanning tunneling microscopy
Surface roughness
Microscopes
microscopes
Scanning
Imaging techniques
Molecules

Manufacturing multi-level metal CMOS with deuterium for improved hot carrier reliability

Kizilyalli, I. C., Abeln, G., Chen, Z., Weber, G., Register, F., Harris, E., Chetlur, S., Higashi, G., Schofieled, M., Sen, S., Kotzias, B., Roy, P. K., Lyding, J. & Hess, K., Dec 1 1998, In : Proceedings of SPIE - The International Society for Optical Engineering. 3506, p. 141-146 6 p.

Research output: Contribution to journalConference article

Hot carriers
Deuterium
deuterium
CMOS
manufacturing

Mechanism for hot-carrier-induced interface trap generation in MOS transistors

Chen, Z., Hess, K., Lee, J., Lyding, J. W., Rosenbaum, E., Kizilyalli, I. & Chetlur, S., Dec 1 1999, In : Technical Digest - International Electron Devices Meeting. p. 85-88 4 p.

Research output: Contribution to journalConference article

Hot carriers
MOSFET devices
Isotopes
transistors
traps

Scanning tunneling microscope-based nanolithography for electronic device fabrication

Lyding, J. W., Brockenbrough, R. T., Fay, P. J., Tucker, J. R., Hess, K. & Higman, T. K., Oct 3 1993, In : Proceedings of SPIE - The International Society for Optical Engineering. 10310, p. 111-126 16 p., 1031008.

Research output: Contribution to journalConference article

Nanolithography
Microscope
Scanning
Fabrication
Microscopes

Scanning tunneling microscopy observation of single dangling bonds on the Si(100)2×1:H surface

Liu, L., Yu, J. & Lyding, J. W., Jan 1 2002, In : Materials Research Society Symposium - Proceedings. 705, p. 187-192 6 p.

Research output: Contribution to journalConference article

Dangling bonds
Scanning tunneling microscopy
scanning tunneling microscopy
ultrahigh vacuum
lithography

Silicon-based molecular nanotechnology

Hersam, M. C., Guisinger, N. P. & Lyding, J. W., Jun 1 2000, In : Nanotechnology. 11, 2, p. 70-76 7 p.

Research output: Contribution to journalConference article

Silicon
nanotechnology
Nanotechnology
Molecules
silicon

Simulation of Si-SiO2 defect generation in CMOS chips: From atomistic structure to chip failure rates

Hess, K., Haggag, A., McMahon, W., Fischer, B., Cheng, K., Lee, J. & Lyding, J. W., Dec 1 2000, In : Technical Digest - International Electron Devices Meeting. p. 93-95 3 p.

Research output: Contribution to journalConference article

CMOS
chips
Degradation
Defects
time dependence

Theory of channel hot-carrier degradation in MOSFETs

Hess, K., Register, L. F., McMahon, W., Tuttle, B., Aktas, O., Ravaioli, U., Lyding, J. W. & Kizilyalli, I. C., Dec 1 1999, In : Physica B: Condensed Matter. 272, 1-4, p. 527-531 5 p.

Research output: Contribution to journalConference article

Hot carriers
MOSFET devices
metal oxide semiconductors
field effect transistors
degradation

Ultrahigh vacuum-scanning tunneling microscopy nanofabrication and hydrogen/deuterium desorption from silicon surfaces: Implications for complementary metal oxide semiconductor technology

Lyding, J. W., Hess, K., Abeln, G. C., Thompson, D. S., Moore, J. S., Hersam, M. C., Foley, E. T., Lee, J., Chen, Z., Hwang, S. T., Choi, H., Avouris, P. & Kizilyalli, I. C., Jan 1 1998, In : Applied Surface Science. 130-132, p. 221-230 10 p.

Research output: Contribution to journalConference article

Deuterium
Ultrahigh vacuum
Scanning tunneling microscopy
Silicon
Nanotechnology
Conference contribution

A scanning tunneling microscopy study: Si/SiO 2 : Interface roughness induced by chemical etching

Yu, J., Liu, L. & Lyding, J. W., Dec 1 2004, Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials. p. 44-49 6 p. (Materials Research Society Symposium Proceedings; vol. 838).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scanning tunneling microscopy
scanning tunneling microscopy
Etching
roughness
Surface roughness

Atomic-scale electrical characterization of carbon nanotubes on silicon surfaces with the UHV-STM

Albrecht, P. M. & Lyding, J. W., Dec 1 2005, 2005 IEEE Workshop on Microelectronics and Electron Devices, WMED. p. 49-52 4 p. 1431615. (2005 IEEE Workshop on Microelectronics and Electron Devices, WMED; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ultrahigh vacuum
Single-walled carbon nanotubes (SWCN)
Carbon nanotubes
Microscopes
Scanning

Atomic-scale study of scattering and electronic properties of CVD graphene grain boundaries

Koepke, J. C., Wood, J. D., Estrada, D., Ong, Z. Y., Xiong, F., Pop, E. & Lyding, J. W., Nov 22 2012, 2012 12th IEEE International Conference on Nanotechnology, NANO 2012. 6322107. (Proceedings of the IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Graphite
Electronic properties
Graphene
Chemical vapor deposition
graphene

Carbon nanotube alignment using meniscus action

Wood, J. D. & Lyding, J. W., Dec 1 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 475-476 2 p. 5394701. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon Nanotubes
Single-walled carbon nanotubes (SWCN)
Carbon nanotubes
Nanoelectronics
Electrophoresis

Deposition and STM investigation of single-walled carbon nanotubes on GaAs(110)

Ruppalt, L. B., Albrecht, P. M. & Lyding, J. W., Dec 1 2004, 2004 4th IEEE Conference on Nanotechnology. p. 13-15 3 p. (2004 4th IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Single-walled carbon nanotubes (SWCN)
Microscopes
Scanning
Energy gap
Substrates

Direct integration of single-walled carbon nanotubes with silicon

Albrecht, P. M., Farrell, R. M., Ye, W. & Lyding, J. W., Jan 1 2003, 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings. IEEE Computer Society, p. 327-330 4 p. 1231784. (Proceedings of the IEEE Conference on Nanotechnology; vol. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon
Single-walled carbon nanotubes (SWCN)
carbon nanotubes
silicon
Substrates

Direct writing of sub-5 nm metals on carbon nanotubes and graphene using a UHV-STM

Ye, W., Martin, P., Kumar, N., Zhang, F., Rockett, A., Abelson, J. R., Girolami, G. S. & Lyding, J. W., Dec 1 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. p. 825-826 2 p. 5394672. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon Nanotubes
Graphite
Scanning tunneling microscopy
Graphene
Carbon nanotubes

Improved graphene growth and fluorination on Cu with clean transfer to surfaces

Wood, J. D., Schmucker, S. W., Haasch, R. T., Doidge, G. P., Nienhaus, L., Damhorst, G. L., Lyons, A. S., Gruebele, M., Bashir, R., Pop, E. & Lyding, J. W., Nov 22 2012, 2012 12th IEEE International Conference on Nanotechnology, NANO 2012. 6322101. (Proceedings of the IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fluorination
fluorination
Graphite
Graphene
graphene

Magnet wire for venus exploration

Arastu, F., Yi, X., Garg, M., Haran, K. & Lyding, J., Jan 1 2019, AIAA Scitech 2019 Forum. American Institute of Aeronautics and Astronautics Inc, AIAA, (AIAA Scitech 2019 Forum).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Magnets
Silica
Wire
Coatings
Reluctance motors

'METAL-LIKE' METALLOMACROCYCLIC POLYMERS. CHEMICAL, PHYSICAL, AND PROCESSING STUDIES.

Inabe, T., Lomax, J. F., Lyding, J. W., Kannewurf, C. R. & Marks, T. J., Dec 1 1983, Polymeric Materials Science and Engineering, Proceedings of the ACS Division of Polymeric Material. ACS, p. 89-93 5 p. (Polymeric Materials Science and Engineering, Proceedings of the ACS Division of Polymeric Material; vol. 49).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Polymers
Processing
Metals

Nanosoldering carbon nanotube junctions with metal via local chemical vapor deposition for improved device performance

Do, J. W., Estrada, D., Xie, X., Chang, N. N., Girolami, G. S., Rogers, J. A., Pop, E. & Lyding, J. W., Nov 22 2012, 2012 12th IEEE International Conference on Nanotechnology, NANO 2012. 6322102. (Proceedings of the IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon Nanotubes
Chemical vapor deposition
Carbon nanotubes
Metals
carbon nanotubes

NEW ELECTRICALLY CONDUCTIVE POLYMERS. DOPANT AND ARCHITECTURAL EFFECTS ON THE COLLECTIVE PROPERTIES OF COFACIALLY JOINED METALLOPHTHALOCYANINES.

Dirk, C. W., Inabe, T., Lyding, J. W., Schoch, K. F., Kannewurf, C. R. & Marks, T. J., Dec 1 1983, Journal of Polymer Science, Polymer Symposia. Allen, C. W. (ed.). 70 ed. p. 1-29 29 p. (Journal of Polymer Science, Polymer Symposia; no. 70).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Doping (additives)
Infrared transmission
Polymers
Magnetic susceptibility
Paramagnetic resonance

RATIONAL CONTROL OF ELECTRONIC STRUCTURE AND LATTICE ARCHITECTURE IN ELECTRICALLY CONDUCTING MOLECULAR/MACROMOLECULAR ASSEMBLIES.

Marks, T. J., Dirk, C. W., Schoch, K. F. & Lyding, J. W., Dec 1 1982, Unknown Host Publication Title. Marcel Dekker Inc, p. 195-212 18 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electronic structure

Scanning tunneling microscopy as a probe of defects iN CuInSe2

Mayer, M., Martin, P., Lyding, J. W. & Rockett, A., Dec 20 2010, Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010. p. 233-238 6 p. 5614487. (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scanning tunneling microscopy
Image resolution
Defects
Spectroscopy
Epitaxial films

Scanning tunneling microscopy characterization of graphene-coated few-layered water on mica

He, K. T., Wood, J. D., Doidge, G. P., Pop, E. & Lyding, J. W., Nov 22 2012, 2012 12th IEEE International Conference on Nanotechnology, NANO 2012. 6321969. (Proceedings of the IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Graphite
Mica
Scanning tunneling microscopy
mica
Graphene

Scanning tunneling microscopy using dynamic laser heating

Ballard, J., Shi, D., Carmichael, E., Pappu, S., Lyding, J. & Gruebele, M., Dec 1 2004, 2004 4th IEEE Conference on Nanotechnology. p. 68-70 3 p. (2004 4th IEEE Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Laser heating
Scanning tunneling microscopy
Heating
Ultrafast lasers
Laser excitation

The effects of a multiple carrier model of interface trap generation on lifetime extraction for MOSFETs

McMahon, W., Matsuda, K., Lee, J., Hess, K. & Lyding, J. W., Dec 1 2002, 2002 International Conference on Modeling and Simulation of Microsystems - MSM 2002. Laudon, M. & Romanowicz, B. (eds.). p. 576-579 4 p. (2002 International Conference on Modeling and Simulation of Microsystems - MSM 2002).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Multiple scattering
Drain current
Extrapolation
Isotopes
Electrons

Theoretical and experimental study of tip electronic structures in scanning tunneling microscope

Choi, H. S., Huang, M., Ballard, J. B., He, K. T., Schmucker, S. W., Lyding, J. W., Randall, J. N. & Cho, K., Dec 1 2009, Computational Nanoscience - How to Exploit Synergy Between Predictive Simulations and Experiment. p. 19-24 6 p. (Materials Research Society Symposium Proceedings; vol. 1177).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron tunneling
Electronic structure
Microscopes
microscopes
electronic structure

Theoretical predictions for carbon nanotube alignment by meniscus action

Wood, J. D., Nazareth, V. & Lyding, J. W., Dec 1 2009, 2009 International Semiconductor Device Research Symposium, ISDRS '09. 5378126. (2009 International Semiconductor Device Research Symposium, ISDRS '09).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon Nanotubes

UHV-STM study of single-walled carbon nanotubes applied to the GaAs(110) and InAs(110) surfaces

Ruppalt, L. B., Albrecht, P. M. & Lyding, J. W., Mar 1 2006, Proceedings - ICFSI-10 - 10th International Conference on the Formation of Semiconductor Interfaces. p. 31-34 4 p. (Journal De Physique. IV : JP; vol. 132).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

ultrahigh vacuum
scanning tunneling microscopy
carbon nanotubes
nanotubes
spectroscopy

Variability of graphene mobility and contacts: Surface effects, doping and strain

Carrion, E. A., Wood, J. D., Behman, A., Tung, M., Lyding, J. W. & Pop, E., Jan 1 2014, 72nd Device Research Conference, DRC 2014 - Conference Digest. Institute of Electrical and Electronics Engineers Inc., p. 199-200 2 p. 6872366. (Device Research Conference - Conference Digest, DRC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Graphene
Polycarbonates
Doping (additives)
Scaffolds
Polymers
Letter
Hot carriers
Deuterium
Isotopes
Leakage currents
Hydrogen
Paper

Application of the deuterium sintering process to improve the device design rule in reducing plasma induced damages

Kim, Y. K., Lee, S. H., Lee, H. S., Kim, B. S., Lee, Y. H., Lee, J., Cheng, K., Chen, Z., Hess, K. & Lyding, J. W., Dec 1 1999, p. 65-68. 4 p.

Research output: Contribution to conferencePaper

Deuterium
Sintering
Plasmas
Interface states
Electrodes

Deuterium passivation in CMOS technology

Lyding, J. W., Lee, J., Cheng, K., Albrecht, P. M., Ruppalt, L. B. & Hess, K., Dec 1 2005, p. 135-143. 9 p.

Research output: Contribution to conferencePaper

Deuterium
Passivation
Desorption
Hydrogen
Hot carriers